Xiaoqing Wen

Person

Fukuoka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Don't-care-bit identification method and don't-care-bit identificat...
- Patent number 8,589,751
- Issue date Nov 19, 2013
- LPTEX Corporation
- Kohei Miyase
- G01 - MEASURING TESTING
Information Patent Grant
Target logic value determination method for unspecified bit in test...
- Patent number 8,453,023
- Issue date May 28, 2013
- LPTEX Corporation
- Kohei Miyase
- G01 - MEASURING TESTING
Information Patent Grant
Generating device, generating method, and program
- Patent number 8,429,472
- Issue date Apr 23, 2013
- National University Corporation Kyushu University Institute of Technology
- Kohei Miyase
- G01 - MEASURING TESTING
Information Patent Grant
Test method and test program of semiconductor logic circuit device
- Patent number 8,117,513
- Issue date Feb 14, 2012
- LPTEX Corporation
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Grant
Test pattern generation method for avoiding false testing in two-pa...
- Patent number 8,001,437
- Issue date Aug 16, 2011
- Kyushu Institute of Technology
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Grant
Generating device, generating method, program and recording medium
- Patent number 7,979,765
- Issue date Jul 12, 2011
- Japan Science and Technology Agency
- Xiaoqing Wen
- G11 - INFORMATION STORAGE
Information Patent Grant
Conversion device, conversion method, program, and recording medium
- Patent number 7,971,118
- Issue date Jun 28, 2011
- Japan Science and Technology Agency
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Grant
Generating device, generating method, program and recording medium
- Patent number 7,962,822
- Issue date Jun 14, 2011
- Japan Science and Technology Agency
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Grant
Diagnostic device, diagnostic method, program, and recording medium
- Patent number 7,913,144
- Issue date Mar 22, 2011
- Japan Science and Technology Agency
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Grant
Computer-aided design system to automate scan synthesis at register...
- Patent number 7,904,857
- Issue date Mar 8, 2011
- Syntest Technologies, Inc.
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Grant
Compacting test responses using X-driven compactor
- Patent number 7,779,322
- Issue date Aug 17, 2010
- Syntest Technologies, Inc.
- Zhigang Wang
- G01 - MEASURING TESTING
Information Patent Grant
Test vector generating method and test vector generating program of...
- Patent number 7,743,306
- Issue date Jun 22, 2010
- Kyushu Institute of Technology
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of fault diagnosis for integrated logic circuits
- Patent number 7,478,295
- Issue date Jan 13, 2009
- Kyushu Institute of Technology
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Grant
Computer-aided design (CAD) multiple-capture DFT system for detecti...
- Patent number 7,434,126
- Issue date Oct 7, 2008
- Syntest Technologies, Inc.
- Laung-Terng Wang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
GENERATION DEVICE, CLASSIFICATION METHOD, GENERATION METHOD, AND PR...
- Publication number 20110209024
- Publication date Aug 25, 2011
- KYUSHU INSTITUTE OF TEHNOLOGY
- Meng-Fan Wu
- G01 - MEASURING TESTING
Information Patent Application
GENERATING DEVICE, GENERATING METHOD, AND PROGRAM
- Publication number 20110140734
- Publication date Jun 16, 2011
- Kohei Miyase
- G01 - MEASURING TESTING
Information Patent Application
DON'T-CARE-BIT IDENTIFICATION METHOD AND DON'T-CARE-BIT IDENTIFICAT...
- Publication number 20100218063
- Publication date Aug 26, 2010
- Kyushu Institute of Technology
- Kohei Miyase
- G01 - MEASURING TESTING
Information Patent Application
LOGIC VALUE DETERMINATION METHOD AND LOGIC VALUE DETERMINATION PROGRAM
- Publication number 20100205491
- Publication date Aug 12, 2010
- Kyushu Institute of Technology
- Kohei Miyase
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEST PATTERN GENERATION METHOD FOR AVOIDING FALSE TESTING IN TWO-PA...
- Publication number 20100095179
- Publication date Apr 15, 2010
- Kyushu Institute of Technology
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD, PROGRAM, AND RECORDING MEDIUM
- Publication number 20100064191
- Publication date Mar 11, 2010
- Japan Science and Technology Agency
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Application
GENERATING DEVICE, GENERATING METHOD, PROGRAM AND RECORDING MEDIUM
- Publication number 20090319842
- Publication date Dec 24, 2009
- Japan Science and Technology Agency
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Application
Test vector generating method and test vector generating program of...
- Publication number 20090259898
- Publication date Oct 15, 2009
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Application
Test Method and Test Program of Semiconductor Logic Circuit Device
- Publication number 20090083593
- Publication date Mar 26, 2009
- Kyushu Institute of Technology
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Application
GENERATING DEVICE, GENERATING METHOD, PROGRAM AND RECORDING MEDIUM
- Publication number 20090019327
- Publication date Jan 15, 2009
- Japan Science and Technology Agency
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Application
CONVERSION DEVICE, CONVERSION METHOD, PROGRAM, AND RECORDING MEDIUM
- Publication number 20080235543
- Publication date Sep 25, 2008
- Japan Science and Technology Agency
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Application
Computer-aided design system to automate scan synthesis at register...
- Publication number 20080134107
- Publication date Jun 5, 2008
- Syntest Technologies, Inc.
- Laung-Terng Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Computer-aided design (CAD) multiple-capture DFT system for detecti...
- Publication number 20070255988
- Publication date Nov 1, 2007
- Syntest Technologies, Inc.
- Laung-Terng Wang
- G06 - COMPUTING CALCULATING COUNTING

Xiaoqing Wen

Person

Patents Grantslast 30 patents

Don't-care-bit identification method and don't-care-bit identificat...

Target logic value determination method for unspecified bit in test...

Generating device, generating method, and program

Test method and test program of semiconductor logic circuit device

Test pattern generation method for avoiding false testing in two-pa...

Generating device, generating method, program and recording medium

Conversion device, conversion method, program, and recording medium

Generating device, generating method, program and recording medium

Diagnostic device, diagnostic method, program, and recording medium

Computer-aided design system to automate scan synthesis at register...

Compacting test responses using X-driven compactor

Test vector generating method and test vector generating program of...

Method and apparatus of fault diagnosis for integrated logic circuits

Computer-aided design (CAD) multiple-capture DFT system for detecti...

Patents Applicationslast 30 patents

GENERATION DEVICE, CLASSIFICATION METHOD, GENERATION METHOD, AND PR...

GENERATING DEVICE, GENERATING METHOD, AND PROGRAM

DON'T-CARE-BIT IDENTIFICATION METHOD AND DON'T-CARE-BIT IDENTIFICAT...

LOGIC VALUE DETERMINATION METHOD AND LOGIC VALUE DETERMINATION PROGRAM

TEST PATTERN GENERATION METHOD FOR AVOIDING FALSE TESTING IN TWO-PA...

DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD, PROGRAM, AND RECORDING MEDIUM

GENERATING DEVICE, GENERATING METHOD, PROGRAM AND RECORDING MEDIUM

Test vector generating method and test vector generating program of...

Test Method and Test Program of Semiconductor Logic Circuit Device

GENERATING DEVICE, GENERATING METHOD, PROGRAM AND RECORDING MEDIUM

CONVERSION DEVICE, CONVERSION METHOD, PROGRAM, AND RECORDING MEDIUM

Computer-aided design system to automate scan synthesis at register...

Computer-aided design (CAD) multiple-capture DFT system for detecti...