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Shanghai, CN
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatus for detecting degree of particulate contamination on flat...
Patent number
10,345,247
Issue date
Jul 9, 2019
SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
Yongqiang Shen
G01 - MEASURING TESTING
Information
Patent Grant
Backside alignment apparatus and method
Patent number
9,188,434
Issue date
Nov 17, 2015
Shanghai Micro Electronics Equipment Co., Ltd.
Bing Xu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
APPARATUS FOR DETECTING DEGREE OF PARTICULATE CONTAMINATION ON FLAT...
Publication number
20180246040
Publication date
Aug 30, 2018
SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
Yongqiang SHEN
G01 - MEASURING TESTING
Information
Patent Application
BACKSIDE ALIGNMENT APPARATUS AND METHOD
Publication number
20130271750
Publication date
Oct 17, 2013
Bing Xu
G01 - MEASURING TESTING