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Patents Grantslast 30 patents

Information Patent Grant
High spatial resolution non-contact temperature measurement
- Patent number 8,809,783
- Issue date Aug 19, 2014
- Rensselaer Polytechnic Institute
- Xiaowei Wu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HIGH SPATIAL RESOLUTION NON-CONTACT TEMPERATURE MEASUREMENT
- Publication number 20130340127
- Publication date Dec 19, 2013
- XIAOWEI WU
- G01 - MEASURING TESTING