Xiaowen Wu

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Houston, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for inspecting materials
- Patent number 7,622,917
- Issue date Nov 24, 2009
- Scan Systems Corp.
- William T. Walters
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for inspecting materials
- Patent number 7,397,238
- Issue date Jul 8, 2008
- William T. Walters
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUS FOR INSPECTING MATERIALS
- Publication number 20080272772
- Publication date Nov 6, 2008
- Scan Systems, Corp
- William T. Walters
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for inspecting materials
- Publication number 20070024278
- Publication date Feb 1, 2007
- Scan Systems, Corp
- William T. Walters
- G01 - MEASURING TESTING