Xiaoxin Zou

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Runtime memory allocation to avoid and delay defect effects in memo...
- Patent number 11,762,567
- Issue date Sep 19, 2023
- Micron Technology, Inc.
- Woei Chen Peh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating die block mapping after detected failure
- Patent number 11,630,727
- Issue date Apr 18, 2023
- Micron Technology, Inc.
- Woei Chen Peh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Runtime memory allocation to avoid and delay defect effects in memo...
- Patent number 11,112,979
- Issue date Sep 7, 2021
- Micron Technology, Inc.
- Woei Chen Peh
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
GENERATING DIE BLOCK MAPPING AFTER DETECTED FAILURE
- Publication number 20220308958
- Publication date Sep 29, 2022
- Micron Technology, Inc.
- Woei Chen Peh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RUNTIME MEMORY ALLOCATION TO AVOID AND DELAY DEFECT EFFECTS IN MEMO...
- Publication number 20210365195
- Publication date Nov 25, 2021
- Micron Technology, Inc.
- Woei Chen Peh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RUNTIME MEMORY ALLOCATION TO AVOID AND DELAY DEFECT EFFECTS IN MEMO...
- Publication number 20210026547
- Publication date Jan 28, 2021
- Micron Technology, Inc.
- Woei Chen Peh
- G06 - COMPUTING CALCULATING COUNTING