Xiaoye Ding

Person

Wuhan, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for semiconductor chip surface topography metro...
- Patent number 11,796,307
- Issue date Oct 24, 2023
- Yangtze Memory Technologies Co., Ltd.
- Sicong Wang
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for semiconductor chip surface topography metro...
- Patent number 11,562,919
- Issue date Jan 24, 2023
- Yangtze Memory Technologies Co., Ltd.
- Sicong Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems having light source with extended spectrum for semiconducto...
- Patent number 11,454,491
- Issue date Sep 27, 2022
- Yangtze Memory Technologies Co., Ltd.
- Sicong Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for semiconductor chip surface topography metro...
- Patent number 11,448,499
- Issue date Sep 20, 2022
- Yangtze Memory Technologies Co., Ltd.
- Sicong Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for semiconductor chip surface topography metro...
- Patent number 11,243,067
- Issue date Feb 8, 2022
- Yangtze Memory Technologies Co., Ltd.
- Sicong Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR SEMICONDUCTOR CHIP SURFACE TOPOGRAPHY METRO...
- Publication number 20230144331
- Publication date May 11, 2023
- Yangtze Memory Technologies Co., Ltd.
- Sicong Wang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SEMICONDUCTOR CHIP SURFACE TOPOGRAPHY METRO...
- Publication number 20220057191
- Publication date Feb 24, 2022
- Yangtze Memory Technologies Co., Ltd.
- Sicong Wang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SEMICONDUCTOR CHIP SURFACE TOPOGRAPHY METRO...
- Publication number 20210262785
- Publication date Aug 26, 2021
- YANGTZE MEMORY TECHNOLOGIES CO., LTD.
- Sicong Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS HAVING LIGHT SOURCE WITH EXTENDED SPECTRUM FOR SEMICONDUCTO...
- Publication number 20210262778
- Publication date Aug 26, 2021
- YANGTZE MEMORY TECHNOLOGIES CO., LTD.
- Sicong Wang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SEMICONDUCTOR CHIP SURFACE TOPOGRAPHY METRO...
- Publication number 20210262779
- Publication date Aug 26, 2021
- YANGTZE MEMORY TECHNOLOGIES CO., LTD.
- Sicong Wang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SEMICONDUCTOR CHIP SURFACE TOPOGRAPHY METRO...
- Publication number 20210265185
- Publication date Aug 26, 2021
- YANGTZE MEMORY TECHNOLOGIES CO., LTD.
- Sicong Wang
- G01 - MEASURING TESTING

Xiaoye Ding

Person

Patents Grantslast 30 patents

Systems and methods for semiconductor chip surface topography metro...

Systems and methods for semiconductor chip surface topography metro...

Systems having light source with extended spectrum for semiconducto...

Systems and methods for semiconductor chip surface topography metro...

Systems and methods for semiconductor chip surface topography metro...

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR SEMICONDUCTOR CHIP SURFACE TOPOGRAPHY METRO...

SYSTEMS AND METHODS FOR SEMICONDUCTOR CHIP SURFACE TOPOGRAPHY METRO...

SYSTEMS AND METHODS FOR SEMICONDUCTOR CHIP SURFACE TOPOGRAPHY METRO...

SYSTEMS HAVING LIGHT SOURCE WITH EXTENDED SPECTRUM FOR SEMICONDUCTO...

SYSTEMS AND METHODS FOR SEMICONDUCTOR CHIP SURFACE TOPOGRAPHY METRO...

SYSTEMS AND METHODS FOR SEMICONDUCTOR CHIP SURFACE TOPOGRAPHY METRO...