Ximan Jiang

Person

San Mateo, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Plasma flood gun for charged particle apparatus
- Patent number 11,830,705
- Issue date Nov 28, 2023
- Ximan Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma flood gun for charged particle apparatus
- Patent number 11,735,398
- Issue date Aug 22, 2023
- Ximan Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for reducing radiation-induced false counts in an...
- Patent number 10,241,217
- Issue date Mar 26, 2019
- KLA-Tencor Corporation
- Ximan Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Plasma source enhanced with booster chamber and low cost plasma str...
- Patent number 9,997,335
- Issue date Jun 12, 2018
- Ximan Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for reducing radiation-induced false counts in an...
- Patent number 9,841,512
- Issue date Dec 12, 2017
- KLA-Tencor Corporation
- Ximan Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Plasma source enhanced with booster chamber and low cost plasma str...
- Patent number 9,691,592
- Issue date Jun 27, 2017
- Ximan Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image intensifier tube design for aberration correction and ion dam...
- Patent number 9,666,419
- Issue date May 30, 2017
- KLA-Tencor Corporation
- Ximan Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution high quantum efficiency electron bombarded CCD or C...
- Patent number 9,460,886
- Issue date Oct 4, 2016
- KLA-Tencor Corporation
- Ximan Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting buried defects
- Patent number 9,116,109
- Issue date Aug 25, 2015
- KLA-Tencor Corporation
- Hong Xiao
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting buried defects
- Patent number 8,723,115
- Issue date May 13, 2014
- KLA-Tencor Corporation
- Hong Xiao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PLASMA FLOOD GUN FOR CHARGED PARTICLE APPARATUS
- Publication number 20220059326
- Publication date Feb 24, 2022
- PIE Scientific LLC
- Ximan Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Reducing Radiation-Induced False Counts in an...
- Publication number 20180045837
- Publication date Feb 15, 2018
- KLA-Tencor Corporation
- Ximan Jiang
- G01 - MEASURING TESTING
Information Patent Application
PLASMA SOURCE ENHANCED WITH BOOSTER CHAMBER AND LOW COST PLASMA STR...
- Publication number 20170294290
- Publication date Oct 12, 2017
- Ximan Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Reducing Radiation-Induced False Counts in an...
- Publication number 20160334516
- Publication date Nov 17, 2016
- KLA-Tencor Corporation
- Ximan Jiang
- G01 - MEASURING TESTING
Information Patent Application
PLASMA SOURCE ENHANCED WITH BOOSTER CHAMBER AND LOW COST PLASMA STR...
- Publication number 20160300696
- Publication date Oct 13, 2016
- Ximan Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High Resolution High Quantum Efficiency Electron Bombarded CCD Or C...
- Publication number 20160027605
- Publication date Jan 28, 2016
- KLA-Tencor Corporation
- Ximan Jiang
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING BURIED DEFECTS
- Publication number 20140319340
- Publication date Oct 30, 2014
- KLA-Tencor Corporation
- Hong XIAO
- G01 - MEASURING TESTING
Information Patent Application
Image Intensifier Tube Design for Aberration Correction and Ion Dam...
- Publication number 20140063502
- Publication date Mar 6, 2014
- KLA-Tencor Corporation
- Ximan Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR DETECTING BURIED DEFECTS
- Publication number 20130256528
- Publication date Oct 3, 2013
- Hong XIAO
- G01 - MEASURING TESTING

Ximan Jiang

Person

Patents Grantslast 30 patents

Plasma flood gun for charged particle apparatus

Plasma flood gun for charged particle apparatus

System and method for reducing radiation-induced false counts in an...

Plasma source enhanced with booster chamber and low cost plasma str...

System and method for reducing radiation-induced false counts in an...

Plasma source enhanced with booster chamber and low cost plasma str...

Image intensifier tube design for aberration correction and ion dam...

High resolution high quantum efficiency electron bombarded CCD or C...

Method and apparatus for detecting buried defects

Method and apparatus for detecting buried defects

Patents Applicationslast 30 patents

PLASMA FLOOD GUN FOR CHARGED PARTICLE APPARATUS

System and Method for Reducing Radiation-Induced False Counts in an...

PLASMA SOURCE ENHANCED WITH BOOSTER CHAMBER AND LOW COST PLASMA STR...

System and Method for Reducing Radiation-Induced False Counts in an...

PLASMA SOURCE ENHANCED WITH BOOSTER CHAMBER AND LOW COST PLASMA STR...

High Resolution High Quantum Efficiency Electron Bombarded CCD Or C...

METHOD AND APPARATUS FOR DETECTING BURIED DEFECTS

Image Intensifier Tube Design for Aberration Correction and Ion Dam...

METHOD AND APPARATUS FOR DETECTING BURIED DEFECTS