Xin HUANG

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Hefei City, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method, apparatus and device for measuring semiconductor structure
- Patent number 12,131,111
- Issue date Oct 29, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xin Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement device and method for semiconductor structure
- Patent number 11,984,366
- Issue date May 14, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xin Huang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR STRUCTURE AND PREPARATION METHOD THEREOF
- Publication number 20240049456
- Publication date Feb 8, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xin HUANG
Information Patent Application
CONTACT STRUCTURE FORMING METHOD, CONTACT STRUCTURE, AND SEMICONDUC...
- Publication number 20230029202
- Publication date Jan 26, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Xin HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT DEVICE AND METHOD FOR SEMICONDUCTOR STRUCTURE
- Publication number 20230024724
- Publication date Jan 26, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Xin HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD, APPARATUS AND DEVICE FOR MEASURING SEMICONDUCTOR STRUCTURE
- Publication number 20220277129
- Publication date Sep 1, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Xin HUANG
- G06 - COMPUTING CALCULATING COUNTING