Xin Jia

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Chengdu, CN

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Patents Grantslast 30 patents

Information Patent Grant
Stitching-measurement device and stitching-measurement method
- Patent number 11,365,964
- Issue date Jun 21, 2022
- The Institute of Optics and Electronics, The Chinese Academy of Sciences
- Fuchao Xu
- G01 - MEASURING TESTING
Information Patent Grant
Detection device for detecting lens surface in stitching interferom...
- Patent number 11,268,808
- Issue date Mar 8, 2022
- The Institute of Optics and Electronics, The Chinese Academy of Sciences
- Dachun Gan
- G01 - MEASURING TESTING
Information Patent Grant
Detection devices and methods using diffraction wavefront of a pinh...
- Patent number 9,250,059
- Issue date Feb 2, 2016
- Institute of Optics and Electronics, Chinese Academy of Science
- Xin Jia
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting optical profile
- Patent number 8,842,292
- Issue date Sep 23, 2014
- Institute of Optics and Electronics, Chinese Academy of Sciences
- Xin Jia
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DETECTION DEVICE FOR DETECTING LENS SURFACE IN STITCHING INTERFEROM...
- Publication number 20210381827
- Publication date Dec 9, 2021
- The Institute of Optics and Electronics, The Chinese Academy of Sciences
- Dachun GAN
- G01 - MEASURING TESTING
Information Patent Application
STITCHING-MEASUREMENT DEVICE AND STITCHING-MEASUREMENT METHOD
- Publication number 20210278201
- Publication date Sep 9, 2021
- Fuchao XU
- G01 - MEASURING TESTING
Information Patent Application
DETECTION DEVICES AND METHODS USING DIFFRACTION WAVEFRONT OF A PINH...
- Publication number 20150362308
- Publication date Dec 17, 2015
- Institute of Optics and Electronics, Chinese Academy of Sciences
- Xin JIA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DETECTING OPTICAL PROFILE
- Publication number 20120050749
- Publication date Mar 1, 2012
- Institute of Optics and Electronics, Chinese Academy of Sciences
- Xin Jia
- G01 - MEASURING TESTING