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Shanghai, CN
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last 30 patents
Information
Patent Grant
Semiconductor device including vertical wire bonds
Patent number
11,749,647
Issue date
Sep 5, 2023
Western Digital Technologies, Inc.
Xiaofeng Di
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Aperture structure on semiconductor component backside to alleviate...
Patent number
11,289,395
Issue date
Mar 29, 2022
Western Digital Technologies, Inc.
Junrong Yan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Spacer layer for embedding semiconductor die
Patent number
9,462,694
Issue date
Oct 4, 2016
SanDisk Semiconductor (Shanghai) Co. Ltd.
Junrong Yan
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Organic cation transporter preferentially expressed in hematopoieti...
Patent number
7,723,019
Issue date
May 25, 2010
University of Kentucky Research Foundation
Jeffrey Moscow
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHODS AND APPARATUSES FOR TRAINING BEHAVIOR PREDICTION MODEL
Publication number
20250103459
Publication date
Mar 27, 2025
ANT WEALTH (SHANGHAI) FINANCIAL INFORMATION SERVICES CO., LTD.
Xiaojing LI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEMICONDUCTOR DEVICE INCLUDING VERTICAL WIRE BONDS
Publication number
20210366875
Publication date
Nov 25, 2021
Western Digital Technologies, Inc.
Xiaofeng Di
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APERTURE STRUCTURE ON SEMICONDUCTOR COMPONENT BACKSIDE TO ALLEVIATE...
Publication number
20200335481
Publication date
Oct 22, 2020
Western Digital Technologies, Inc.
Junrong Yan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SPACER LAYER FOR EMBEDDING SEMICONDUCTOR DIE
Publication number
20150187421
Publication date
Jul 2, 2015
Sandisk Semiconductor (Shanghai) Co., Ltd.
Junrong Yan
G11 - INFORMATION STORAGE
Information
Patent Application
Organic cation transporter preferentially expressed in hematopoieti...
Publication number
20070269846
Publication date
Nov 22, 2007
University of Kentucky Research Foundation
Jeffrey Moscow
G01 - MEASURING TESTING