Xin Man

Person

Chiba, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Cross-section observation device, and control method
- Patent number 11,600,463
- Issue date Mar 7, 2023
- Hitachi High-Tech Science Corporation
- Xin Man
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam irradiation apparatus and control method
- Patent number 11,424,100
- Issue date Aug 23, 2022
- Hitachi High-Tech Science Corporation
- Takuma Aso
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam irradiation apparatus
- Patent number 11,335,534
- Issue date May 17, 2022
- Hitachi High-Tech Science Corporation
- Takuma Aso
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus, method, and program for processing and observing cross s...
- Patent number 11,114,276
- Issue date Sep 7, 2021
- Hitachi High-Tech Science Corporation
- Xin Man
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cross section processing observation method and charged particle be...
- Patent number 10,692,695
- Issue date Jun 23, 2020
- Hitachi High-Tech Science Corporation
- Xin Man
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for cross-section processing and observation and apparatus t...
- Patent number 10,242,842
- Issue date Mar 26, 2019
- Hitachi High-Tech Science Corporation
- Xin Man
- G02 - OPTICS
Information Patent Grant
Cross-section processing-and-observation method and cross-section p...
- Patent number 10,096,449
- Issue date Oct 9, 2018
- Hitachi High-Tech Science Corporation
- Xin Man
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross-section processing and observation method and cross-section p...
- Patent number 9,966,226
- Issue date May 8, 2018
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam apparatus, method for observing cross-section of s...
- Patent number 9,934,938
- Issue date Apr 3, 2018
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Crystal analysis apparatus, composite charged particle beam device,...
- Patent number 9,470,642
- Issue date Oct 18, 2016
- Hitachi High-Tech Science Corporation
- Xin Man
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus and sample observation method
- Patent number 9,384,941
- Issue date Jul 5, 2016
- Hitachi High-Tech Science Corporation
- Xin Man
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, control method for charged particle b...
- Patent number 9,368,323
- Issue date Jun 14, 2016
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross-section processing-and-observation method and cross-section p...
- Patent number 9,347,896
- Issue date May 24, 2016
- Hitachi High-Tech Science Corporation
- Xin Man
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,318,303
- Issue date Apr 19, 2016
- Hitachi High-Tech Science Corporation
- Xin Man
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample observation method, sample preparation method, and charged p...
- Patent number 9,287,087
- Issue date Mar 15, 2016
- Hitachi High-Tech Science Corporation
- Xin Man
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample preparation method
- Patent number 9,260,782
- Issue date Feb 16, 2016
- Hitachi High-Tech Science Corporation
- Xin Man
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,245,713
- Issue date Jan 26, 2016
- Hitachi High-Tech Science Corporation
- Xin Man
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite charged particle beam apparatus
- Patent number 9,214,316
- Issue date Dec 15, 2015
- Hitachi High-Tech Science Corporation
- Yo Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus and sample processing method using...
- Patent number 9,202,671
- Issue date Dec 1, 2015
- Hitachi High-Tech Science Corporation
- Xin Man
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross-section processing and observation method and cross-section p...
- Patent number 9,080,945
- Issue date Jul 14, 2015
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- G01 - MEASURING TESTING
Information Patent Grant
Crystal analysis apparatus, composite charged particle beam device,...
- Patent number 9,046,472
- Issue date Jun 2, 2015
- Hitachi High-Tech Science Corporation
- Xin Man
- G01 - MEASURING TESTING
Information Patent Grant
Cross-section processing and observation method and cross-section p...
- Patent number 8,853,629
- Issue date Oct 7, 2014
- Hitachi High-Tech Science Corporation
- Xin Man
- G01 - MEASURING TESTING
Information Patent Grant
Sample preparation apparatus and sample preparation method
- Patent number 8,803,111
- Issue date Aug 12, 2014
- Hitachi High-Tech Science Corporation
- Xin Man
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite charged particle beam apparatus
- Patent number 8,642,980
- Issue date Feb 4, 2014
- Hitachi High-Tech Science Corporation
- Xin Man
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam system and sample processing method using the same
- Patent number 8,581,206
- Issue date Nov 12, 2013
- SII NanoTechnology Inc.
- Xin Man
- G01 - MEASURING TESTING
Information Patent Grant
Sample processing and observing method
- Patent number 8,274,049
- Issue date Sep 25, 2012
- SII NanoTechnology Inc.
- Keiichi Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of preparing a transmission electron microscope sample and a...
- Patent number 8,191,168
- Issue date May 29, 2012
- SII NanoTechnology Inc.
- Xin Man
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
MACHINING METHOD AND CHARGED PARTICLE BEAM DEVICE
- Publication number 20250140518
- Publication date May 1, 2025
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Toshiyuki NAGAMINE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTROL METHOD, CHARGED PARTICLE BEAM DEVICE, AND PROGRAM
- Publication number 20240379323
- Publication date Nov 14, 2024
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Toshiyuki NAGAMINE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OBSERVING BIOLOGICAL TISSUE SAMPLE
- Publication number 20210293668
- Publication date Sep 23, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE BEAM IRRADIATION APPARATUS
- Publication number 20210090853
- Publication date Mar 25, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Takuma ASO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM IRRADIATION APPARATUS AND CONTROL METHOD
- Publication number 20210090855
- Publication date Mar 25, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Takuma ASO
- G01 - MEASURING TESTING
Information Patent Application
CROSS-SECTION OBSERVATION DEVICE, AND CONTROL METHOD
- Publication number 20200111639
- Publication date Apr 9, 2020
- Hitachi High-Tech Science Corporation
- XIN MAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS, METHOD, AND PROGRAM FOR PROCESSING AND OBSERVING CROSS S...
- Publication number 20190279843
- Publication date Sep 12, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CROSS SECTION PROCESSING OBSERVATION METHOD AND CHARGED PARTICLE BE...
- Publication number 20190164722
- Publication date May 30, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CROSS-SECTION PROCESSING AND OBSERVATION AND APPARATUS T...
- Publication number 20170278668
- Publication date Sep 28, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- G02 - OPTICS
Information Patent Application
CROSS-SECTION PROCESSING-AND-OBSERVATION METHOD AND CROSS-SECTION P...
- Publication number 20160343541
- Publication date Nov 24, 2016
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CROSS-SECTION PROCESSING AND OBSERVATION METHOD AND CROSS-SECTION P...
- Publication number 20150262788
- Publication date Sep 17, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi UEMOTO
- G01 - MEASURING TESTING
Information Patent Application
CRYSTAL ANALYSIS APPARATUS, COMPOSITE CHARGED PARTICLE BEAM DEVICE,...
- Publication number 20150226684
- Publication date Aug 13, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND SAMPLE OBSERVATION METHOD
- Publication number 20150206706
- Publication date Jul 23, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, CONTROL METHOD FOR CHARGED PARTICLE B...
- Publication number 20150206702
- Publication date Jul 23, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi UEMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20150060695
- Publication date Mar 5, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20150060668
- Publication date Mar 5, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CROSS-SECTION PROCESSING-AND-OBSERVATION METHOD AND CROSS-SECTION P...
- Publication number 20150060664
- Publication date Mar 5, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- G01 - MEASURING TESTING
Information Patent Application
FOCUSED ION BEAM APPARATUS, METHOD FOR OBSERVING CROSS-SECTION OF S...
- Publication number 20140291508
- Publication date Oct 2, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi UEMOTO
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND SAMPLE PROCESSING METHOD USING...
- Publication number 20140291511
- Publication date Oct 2, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CROSS-SECTION PROCESSING AND OBSERVATION METHOD AND CROSS-SECTION P...
- Publication number 20140131575
- Publication date May 15, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi UEMOTO
- G01 - MEASURING TESTING
Information Patent Application
CRYSTAL ANALYSIS APPARATUS, COMPOSITE CHARGED PARTICLE BEAM DEVICE,...
- Publication number 20140077097
- Publication date Mar 20, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- G01 - MEASURING TESTING
Information Patent Application
CROSS-SECTION PROCESSING AND OBSERVATION METHOD AND CROSS-SECTION P...
- Publication number 20130248708
- Publication date Sep 26, 2013
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PREPARATION METHOD
- Publication number 20130251914
- Publication date Sep 26, 2013
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SAMPLE OBSERVATION METHOD, SAMPLE PREPARATION METHOD, AND CHARGED P...
- Publication number 20130248707
- Publication date Sep 26, 2013
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOSITE CHARGED PARTICLE BEAM APPARATUS
- Publication number 20130248735
- Publication date Sep 26, 2013
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE PREPARATION APPARATUS AND SAMPLE PREPARATION METHOD
- Publication number 20130241091
- Publication date Sep 19, 2013
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOSITE CHARGED PARTICLE BEAM APPARATUS
- Publication number 20130082176
- Publication date Apr 4, 2013
- Yo YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
Sample processing and observing method
- Publication number 20110226948
- Publication date Sep 22, 2011
- Keiichi Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FOCUSED ION BEAM SYSTEM AND SAMPLE PROCESSING METHOD USING THE SAME
- Publication number 20100213386
- Publication date Aug 26, 2010
- Xin Man
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PREPARING A TRANSMISSION ELECTRON MICROSCOPE SAMPLE AND A...
- Publication number 20090119807
- Publication date May 7, 2009
- Xin Man
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Cross-section observation device, and control method

Charged particle beam irradiation apparatus and control method

Particle beam irradiation apparatus

Apparatus, method, and program for processing and observing cross s...

Cross section processing observation method and charged particle be...

Method for cross-section processing and observation and apparatus t...

Cross-section processing-and-observation method and cross-section p...

Cross-section processing and observation method and cross-section p...

Focused ion beam apparatus, method for observing cross-section of s...

Crystal analysis apparatus, composite charged particle beam device,...

Charged particle beam apparatus and sample observation method

Charged particle beam device, control method for charged particle b...

Cross-section processing-and-observation method and cross-section p...

Charged particle beam apparatus

Sample observation method, sample preparation method, and charged p...

Sample preparation method

Charged particle beam apparatus

Composite charged particle beam apparatus

Charged particle beam apparatus and sample processing method using...

Cross-section processing and observation method and cross-section p...

Crystal analysis apparatus, composite charged particle beam device,...

Cross-section processing and observation method and cross-section p...

Sample preparation apparatus and sample preparation method

Composite charged particle beam apparatus

Focused ion beam system and sample processing method using the same

Sample processing and observing method

Method of preparing a transmission electron microscope sample and a...

Patents Applicationslast 30 patents

MACHINING METHOD AND CHARGED PARTICLE BEAM DEVICE

CONTROL METHOD, CHARGED PARTICLE BEAM DEVICE, AND PROGRAM

METHOD FOR OBSERVING BIOLOGICAL TISSUE SAMPLE

PARTICLE BEAM IRRADIATION APPARATUS

CHARGED PARTICLE BEAM IRRADIATION APPARATUS AND CONTROL METHOD

CROSS-SECTION OBSERVATION DEVICE, AND CONTROL METHOD

APPARATUS, METHOD, AND PROGRAM FOR PROCESSING AND OBSERVING CROSS S...

CROSS SECTION PROCESSING OBSERVATION METHOD AND CHARGED PARTICLE BE...

METHOD FOR CROSS-SECTION PROCESSING AND OBSERVATION AND APPARATUS T...

CROSS-SECTION PROCESSING-AND-OBSERVATION METHOD AND CROSS-SECTION P...

CROSS-SECTION PROCESSING AND OBSERVATION METHOD AND CROSS-SECTION P...

CRYSTAL ANALYSIS APPARATUS, COMPOSITE CHARGED PARTICLE BEAM DEVICE,...

CHARGED PARTICLE BEAM APPARATUS AND SAMPLE OBSERVATION METHOD

CHARGED PARTICLE BEAM DEVICE, CONTROL METHOD FOR CHARGED PARTICLE B...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

CROSS-SECTION PROCESSING-AND-OBSERVATION METHOD AND CROSS-SECTION P...

FOCUSED ION BEAM APPARATUS, METHOD FOR OBSERVING CROSS-SECTION OF S...

CHARGED PARTICLE BEAM APPARATUS AND SAMPLE PROCESSING METHOD USING...

CROSS-SECTION PROCESSING AND OBSERVATION METHOD AND CROSS-SECTION P...

CRYSTAL ANALYSIS APPARATUS, COMPOSITE CHARGED PARTICLE BEAM DEVICE,...

CROSS-SECTION PROCESSING AND OBSERVATION METHOD AND CROSS-SECTION P...

SAMPLE PREPARATION METHOD

SAMPLE OBSERVATION METHOD, SAMPLE PREPARATION METHOD, AND CHARGED P...

COMPOSITE CHARGED PARTICLE BEAM APPARATUS

SAMPLE PREPARATION APPARATUS AND SAMPLE PREPARATION METHOD

COMPOSITE CHARGED PARTICLE BEAM APPARATUS

Sample processing and observing method

FOCUSED ION BEAM SYSTEM AND SAMPLE PROCESSING METHOD USING THE SAME

METHOD OF PREPARING A TRANSMISSION ELECTRON MICROSCOPE SAMPLE AND A...