Xin Zhou

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Saratoga, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Determining calibration parameters for a lithographic process
- Patent number 8,849,008
- Issue date Sep 30, 2014
- Synopsys, Inc.
- Xin Zhou
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Spatial map of mask-pattern defects
- Patent number 8,510,683
- Issue date Aug 13, 2013
- Synopsys, Inc.
- Jun Peng
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Determining calibration parameters for a lithographic process
- Patent number 8,285,030
- Issue date Oct 9, 2012
- Synopsys, Inc.
- Xin Zhou
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
SPATIAL MAP OF MASK-PATTERN DEFECTS
- Publication number 20130152026
- Publication date Jun 13, 2013
- Luminescent Technologies, Inc.
- Jun PENG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Determining Calibration Parameters For a Lithographic Process
- Publication number 20130004056
- Publication date Jan 3, 2013
- Synopsys, Inc.
- Xin Zhou
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Determining Calibration Parameters for a Lithographic Process
- Publication number 20110222739
- Publication date Sep 15, 2011
- Xin Zhou
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY