Xing Wei

Person

Shanghai, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Method for characterizing defects in silicon crystal
- Patent number 12,092,588
- Issue date Sep 17, 2024
- ZING SEMICONDUCTOR CORPORATION
- Xing Wei
- C30 - CRYSTAL GROWTH
Information Patent Grant
Silicon on insulator structure and method of making the same
- Patent number 11,443,941
- Issue date Sep 13, 2022
- ZING SEMICONDUCTOR CORPORATION
- Xing Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bonding method for semiconductor substrate, and bonded semiconducto...
- Patent number 11,393,772
- Issue date Jul 19, 2022
- Shanghai Simgui Technology Co., Ltd.
- Xing Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon on insulator structure and method of making the same
- Patent number 11,393,712
- Issue date Jul 19, 2022
- ZING SEMICONDUCTOR CORPORATION
- Xing Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Heat shield structure for single crystal production furnace and sin...
- Patent number 11,352,713
- Issue date Jun 7, 2022
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Zhongying Xue
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method for cleaning bonding interface before bonding
- Patent number 10,618,082
- Issue date Apr 14, 2020
- Shanghai Simgui Technology Co., Ltd.
- Xing Wei
- C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information Patent Grant
Annealing method for improving bonding strength
- Patent number 10,529,590
- Issue date Jan 7, 2020
- Shanghai Simgui Technology Co., Ltd.
- Xing Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for preparing substrate with insulated buried layer
- Patent number 10,388,529
- Issue date Aug 20, 2019
- Shanghai Simgui Technology Co., Ltd.
- Xing Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for preparing substrate with carrier trapping center
- Patent number 10,361,114
- Issue date Jul 23, 2019
- Shanghai Simgui Technology Co., Ltd.
- Xing Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for preparing semiconductor substrate with insulating buried...
- Patent number 9,299,556
- Issue date Mar 29, 2016
- SHANGHAI SIMGUI TECHNOLOGY CO. LTD.
- Xing Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming substrate with buried insulating layer
- Patent number 8,633,090
- Issue date Jan 21, 2014
- Shanghai Simgui Technology Co., Ltd.
- Xiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD protection devices for SOI integrated circuit and manufacturing...
- Patent number 8,461,651
- Issue date Jun 11, 2013
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Xiaolu Huang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
STRUCTURE OF HIGH-RESISTIVITY SILICON-ON-INSULATOR EMBEDDED WITH CH...
- Publication number 20240387241
- Publication date Nov 21, 2024
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE OF HIGH-RESISTIVITY SILICON-ON-INSULATOR EMBEDDED WITH CH...
- Publication number 20240387171
- Publication date Nov 21, 2024
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYSTAL GROWING METHOD, APPARATUS AND RF-SOI SUBSTRATE
- Publication number 20240218564
- Publication date Jul 4, 2024
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR DETERMINING TYPES OF DEFECTS IN MONOCRYSTALLINE SILICON...
- Publication number 20240183797
- Publication date Jun 6, 2024
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PREPARING SILICON-ON-INSULATOR
- Publication number 20240153764
- Publication date May 9, 2024
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PREPARATION METHOD OF P-TYPE HIGH-RESISTANCE AND ULTRA-HIGH-RESISTA...
- Publication number 20240141547
- Publication date May 2, 2024
- Shanghai Institute of Microsystem and Information Technology Chinese Academy...
- Xing Wei
- C30 - CRYSTAL GROWTH
Information Patent Application
SOI WAFER
- Publication number 20240096645
- Publication date Mar 21, 2024
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF GROWING A SINGLE-CRYSTAL SILICON
- Publication number 20230323561
- Publication date Oct 12, 2023
- ZING SEMICONDUCTOR CORPORATION
- Yinfeng LI
- C30 - CRYSTAL GROWTH
Information Patent Application
SEMICONDUCTOR SUBSTRATE AND MANUFACTURE THEREOF
- Publication number 20230178366
- Publication date Jun 8, 2023
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SURFACE TREATMENT OF SOI WAFER
- Publication number 20230137599
- Publication date May 4, 2023
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- C30 - CRYSTAL GROWTH
Information Patent Application
PROCESS OF SURFACE TREATMENT OF SOI WAFER
- Publication number 20230133916
- Publication date May 4, 2023
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOI STRUCTURED SEMICONDUCTOR SILICON WAFER AND METHOD OF MAKING THE...
- Publication number 20230133092
- Publication date May 4, 2023
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOI WAFER AND METHOD OF FINAL PROCESSING THE SAME
- Publication number 20230134308
- Publication date May 4, 2023
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR TREATING A WAFER SURFACE
- Publication number 20230138958
- Publication date May 4, 2023
- Shanghai Institute of Microsystem and Information Technology Chinese Academy...
- Xing Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR IMPROVING THE SURFACE ROUGHNESS OF A SILICON-ON-INSULATO...
- Publication number 20230137992
- Publication date May 4, 2023
- Shanghai Institute of Microsystem and Information Technology Chinese Academy...
- Xing Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING METHOD OF RESISTIVITY OF A WAFER
- Publication number 20230040616
- Publication date Feb 9, 2023
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR VERIFICATION OF CONDUCTIVITY TYPE OF SILICON WAFER
- Publication number 20230037569
- Publication date Feb 9, 2023
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEALANT COMPOSITION
- Publication number 20230022605
- Publication date Jan 26, 2023
- Dow Silicones Corporation
- Zhiping ZENG
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
METHOD OF DETECTING CRYSTALLOGRAPHIC DEFECTS AND METHOD OF GROWING...
- Publication number 20220333269
- Publication date Oct 20, 2022
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR CHARACTERIZING DEFECTS IN SILICON CRYSTAL
- Publication number 20220291145
- Publication date Sep 15, 2022
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- G01 - MEASURING TESTING
Information Patent Application
SILICON ON INSULATOR STRUCTURE AND METHOD OF MAKING THE SAME
- Publication number 20220181150
- Publication date Jun 9, 2022
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON ON INSULATOR STRUCTURE AND METHOD OF MAKING THE SAME
- Publication number 20220181200
- Publication date Jun 9, 2022
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HEAT SHIELD FOR MONOCRYSTALLINE SILICON GROWTH FURNACE AND MONOCRYS...
- Publication number 20220002899
- Publication date Jan 6, 2022
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
- Zhongying Xue
- C30 - CRYSTAL GROWTH
Information Patent Application
THIN-FILM HEAT INSULATION SHEET FOR MONOCRYSTALLINE SILICON GROWTH...
- Publication number 20220002900
- Publication date Jan 6, 2022
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
- Xing Wei
- C30 - CRYSTAL GROWTH
Information Patent Application
HEAT SHIELD DEVICE FOR SINGLE CRYSTAL PRODUCTION FURNACE, CONTROL M...
- Publication number 20220002903
- Publication date Jan 6, 2022
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
- Zhongying Xue
- C30 - CRYSTAL GROWTH
Information Patent Application
HEAT SHIELD DEVICE AND SMELTING FURNACE
- Publication number 20220002901
- Publication date Jan 6, 2022
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
- Xing Wei
- C30 - CRYSTAL GROWTH
Information Patent Application
HEAT SHIELD STRUCTURE FOR SINGLE CRYSTAL PRODUCTION FURNACE AND SIN...
- Publication number 20220002898
- Publication date Jan 6, 2022
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
- Zhongying Xue
- C30 - CRYSTAL GROWTH
Information Patent Application
COMPOSITE HEAT INSULATION STRUCTURE FOR MONOCRYSTALLINE SILICON GRO...
- Publication number 20220005766
- Publication date Jan 6, 2022
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
- Xing Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HEAT SHIELD DEVICE FOR INSULATING HEAT AND SMELTING FURNACE
- Publication number 20220002902
- Publication date Jan 6, 2022
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
- Zhongying Xue
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR PLANARIZING WAFER SURFACE
- Publication number 20200168452
- Publication date May 28, 2020
- SHANGHAI SIMGUI TECHNOLOGY CO., LTD.
- Xing WEI
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Method for characterizing defects in silicon crystal

Silicon on insulator structure and method of making the same

Bonding method for semiconductor substrate, and bonded semiconducto...

Silicon on insulator structure and method of making the same

Heat shield structure for single crystal production furnace and sin...

Method for cleaning bonding interface before bonding

Annealing method for improving bonding strength

Method for preparing substrate with insulated buried layer

Method for preparing substrate with carrier trapping center

Method for preparing semiconductor substrate with insulating buried...

Method for forming substrate with buried insulating layer

ESD protection devices for SOI integrated circuit and manufacturing...

Patents Applicationslast 30 patents

STRUCTURE OF HIGH-RESISTIVITY SILICON-ON-INSULATOR EMBEDDED WITH CH...

STRUCTURE OF HIGH-RESISTIVITY SILICON-ON-INSULATOR EMBEDDED WITH CH...

CRYSTAL GROWING METHOD, APPARATUS AND RF-SOI SUBSTRATE

METHOD FOR DETERMINING TYPES OF DEFECTS IN MONOCRYSTALLINE SILICON...

METHOD FOR PREPARING SILICON-ON-INSULATOR

PREPARATION METHOD OF P-TYPE HIGH-RESISTANCE AND ULTRA-HIGH-RESISTA...

SOI WAFER

METHOD OF GROWING A SINGLE-CRYSTAL SILICON

SEMICONDUCTOR SUBSTRATE AND MANUFACTURE THEREOF

SURFACE TREATMENT OF SOI WAFER

PROCESS OF SURFACE TREATMENT OF SOI WAFER

SOI STRUCTURED SEMICONDUCTOR SILICON WAFER AND METHOD OF MAKING THE...

SOI WAFER AND METHOD OF FINAL PROCESSING THE SAME

METHOD FOR TREATING A WAFER SURFACE

METHOD FOR IMPROVING THE SURFACE ROUGHNESS OF A SILICON-ON-INSULATO...

MEASURING METHOD OF RESISTIVITY OF A WAFER

METHOD FOR VERIFICATION OF CONDUCTIVITY TYPE OF SILICON WAFER

SEALANT COMPOSITION

METHOD OF DETECTING CRYSTALLOGRAPHIC DEFECTS AND METHOD OF GROWING...

METHOD FOR CHARACTERIZING DEFECTS IN SILICON CRYSTAL

SILICON ON INSULATOR STRUCTURE AND METHOD OF MAKING THE SAME

SILICON ON INSULATOR STRUCTURE AND METHOD OF MAKING THE SAME

HEAT SHIELD FOR MONOCRYSTALLINE SILICON GROWTH FURNACE AND MONOCRYS...

THIN-FILM HEAT INSULATION SHEET FOR MONOCRYSTALLINE SILICON GROWTH...

HEAT SHIELD DEVICE FOR SINGLE CRYSTAL PRODUCTION FURNACE, CONTROL M...

HEAT SHIELD DEVICE AND SMELTING FURNACE

HEAT SHIELD STRUCTURE FOR SINGLE CRYSTAL PRODUCTION FURNACE AND SIN...

COMPOSITE HEAT INSULATION STRUCTURE FOR MONOCRYSTALLINE SILICON GRO...

HEAT SHIELD DEVICE FOR INSULATING HEAT AND SMELTING FURNACE

METHOD FOR PLANARIZING WAFER SURFACE