Xing Zhou

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Poughkeepsie, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Test structure for detection of gap in conductive layer of multilay...
- Patent number 8,766,259
- Issue date Jul 1, 2014
- International Business Machines Corporation
- Renee T. Mo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structure for detection of gap in conductive layer of multilay...
- Patent number 8,399,266
- Issue date Mar 19, 2013
- International Business Machines Corporation
- Renee T. Mo
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TEST STRUCTURE FOR DETECTION OF GAP IN CONDUCTIVE LAYER OF MULTILAY...
- Publication number 20130140565
- Publication date Jun 6, 2013
- International Business Machines Corporation
- Renee T. Mo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURE FOR DETECTION OF GAP IN CONDUCTIVE LAYER OF MULTILAY...
- Publication number 20120187400
- Publication date Jul 26, 2012
- International Business Machines Corporation
- Renee T. Mo
- H01 - BASIC ELECTRIC ELEMENTS