Xinggang WANG

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Suzhou, CN

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Patents Grantslast 30 patents

Information Patent Grant
Probe card for testing power devices under high temperature and hig...
- Patent number 12,158,481
- Issue date Dec 3, 2024
- MAXONE SEMICONDUCTOR (SUZHOU) CO., LTD.
- Liangyu Zhao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
A PROBE CARD FOR TESTING POWER DEVICES UNDER HIGH TEMPERATURE AND H...
- Publication number 20230258690
- Publication date Aug 17, 2023
- MAXONE SEMICONDUCTOR CO., LTD.
- Liangyu ZHAO
- G01 - MEASURING TESTING