Xinghao Chen

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Endwell, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Spectral and information theoretic method of test point, partial-sc...
- Patent number 8,164,345
- Issue date Apr 24, 2012
- Rutgers, The State University of New Jersey
- Michael L. Bushnell
- G01 - MEASURING TESTING
Information Patent Grant
Scan-load-based dynamic scan configuration
- Patent number 7,702,980
- Issue date Apr 20, 2010
- Xinghao Chen
- G01 - MEASURING TESTING
Information Patent Grant
Test sequences generated by automatic test pattern generation and a...
- Patent number 6,922,800
- Issue date Jul 26, 2005
- Cadence Design Systems, Inc.
- Xinghao Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Test sequences generated by automatic test pattern generation and a...
- Patent number 6,618,826
- Issue date Sep 9, 2003
- Cadence Design Systems, Inc.
- Xinghao Chen
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Spectral and information theoretic method of test point, partial-sc...
- Publication number 20100102825
- Publication date Apr 29, 2010
- Rutgers, The State University of New Jersey
- Michael L. Bushnell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Scan-load-based dynamic scan configuration
- Publication number 20090132882
- Publication date May 21, 2009
- Xinghao Chen
- G01 - MEASURING TESTING
Information Patent Application
Test sequences generated by automatic test pattern generation and a...
- Publication number 20040128406
- Publication date Jul 1, 2004
- Cadence Design Systems, Inc.
- Xinghao Chen
- G11 - INFORMATION STORAGE
Information Patent Application
Efficiency of fault simulation by logic backtracking
- Publication number 20020188904
- Publication date Dec 12, 2002
- International Business Machines Corporation
- Xinghao Chen
- G01 - MEASURING TESTING