Xingjun Jiang

Person

  • Nirasaki City, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Testing system

    • Patent number 11,454,664
    • Issue date Sep 27, 2022
    • Tokyo Electron Limited
    • Kentaro Konishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Inspection system

    • Patent number 11,360,115
    • Issue date Jun 14, 2022
    • Tokyo Electron Limited
    • Takanori Hyakudomi
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    TESTING SYSTEM

    • Publication number 20210333319
    • Publication date Oct 28, 2021
    • TOKYO ELECTRON LIMITED
    • Kentaro KONISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    INSPECTION SYSTEM

    • Publication number 20190265272
    • Publication date Aug 29, 2019
    • TOKYO ELECTRON LIMITED
    • Takanori Hyakudomi
    • G01 - MEASURING TESTING