Beijing, CN
Information
Patent Grant
NATIONAL INSTITUTE OF METROLOGY, CHINA
Zejian Huang
G01 - MEASURING TESTING
Information
Patent Application
NATIONAL INSTITUTE OF METROLOGY, CHINA
Xiaoyun GONG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NATIONAL INSTITUTE OF METROLOGY, CHINA
Siyuan TAN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NATIONAL INSTITUTE OF METROLOGY, CHINA
Liqing WU
C07 - ORGANIC CHEMISTRY
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Patent Application
National Institute of Metrology,China
Rui ZHAI
G01 - MEASURING TESTING
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Patent Application
NATIONAL INSTITUTE OF METROLOGY, CHINA
Shiying CHU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NATIONAL INSTITUTE OF METROLOGY, CHINA
Zejian HUANG
G01 - MEASURING TESTING
