Xinran LIU

Person

Hefei City, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Method for obtaining parameters of semiconductor structure, method...
- Patent number 12,308,295
- Issue date May 20, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xinran Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 12,193,207
- Issue date Jan 7, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xinran Liu
Information Patent Grant
Method for forming capacitor via
- Patent number 12,183,776
- Issue date Dec 31, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chunyang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for predicting inclination angle, and method and...
- Patent number 12,176,252
- Issue date Dec 24, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Bo Shao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process monitoring method and process monitoring system
- Patent number 12,107,021
- Issue date Oct 1, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chunyang Wang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING SAME
- Publication number 20240064971
- Publication date Feb 22, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Zhicheng Shi
Information Patent Application
SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF
- Publication number 20230301066
- Publication date Sep 21, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Gongyi WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREFOR
- Publication number 20230282687
- Publication date Sep 7, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Gongyi WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE AND SEMICONDUCTOR...
- Publication number 20230238249
- Publication date Jul 27, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Bo SHAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE AND METHOD FOR FABRICATING SAME
- Publication number 20230225104
- Publication date Jul 13, 2023
- Changxin Memory Technologies, Inc.
- Yong LU
Information Patent Application
METHOD FOR FORMING CAPACITOR VIA
- Publication number 20230029832
- Publication date Feb 2, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chunyang WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OBTAINING PARAMETERS OF SEMICONDUCTOR STRUCTURE, METHOD...
- Publication number 20220238393
- Publication date Jul 28, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Xinran LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR PREDICTING INCLINATION ANGLE, AND METHOD AND...
- Publication number 20220223479
- Publication date Jul 14, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Bo SHAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS MONITORING METHOD AND PROCESS MONITORING SYSTEM
- Publication number 20220199474
- Publication date Jun 23, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Chunyang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20220085021
- Publication date Mar 17, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Xinran LIU
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Method for obtaining parameters of semiconductor structure, method...

Semiconductor device and method for manufacturing the same

Method for forming capacitor via

Method and device for predicting inclination angle, and method and...

Process monitoring method and process monitoring system

Patents Applicationslast 30 patents

SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING SAME

SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF

SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREFOR

METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE AND SEMICONDUCTOR...

SEMICONDUCTOR STRUCTURE AND METHOD FOR FABRICATING SAME

METHOD FOR FORMING CAPACITOR VIA

METHOD FOR OBTAINING PARAMETERS OF SEMICONDUCTOR STRUCTURE, METHOD...

METHOD AND DEVICE FOR PREDICTING INCLINATION ANGLE, AND METHOD AND...

PROCESS MONITORING METHOD AND PROCESS MONITORING SYSTEM

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME