Xinwang CHEN

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Hefei City, CN

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Patents Grantslast 30 patents

Information Patent Grant
Power consumption measurement assembly and method, and chip power c...
- Patent number 12,032,022
- Issue date Jul 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xinwang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Current test circuit, device and method, and storage medium
- Patent number 11,977,116
- Issue date May 7, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Maosong Ma
- G01 - MEASURING TESTING
Information Patent Grant
Test fixture
- Patent number 11,933,815
- Issue date Mar 19, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Maosong Ma
- G01 - MEASURING TESTING
Information Patent Grant
Method, device and system for testing memory devices
- Patent number 11,893,284
- Issue date Feb 6, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xinwang Chen
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD, DEVICE AND SYSTEM FOR TESTING MEMORY DEVICES
- Publication number 20230015543
- Publication date Jan 19, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Xinwang CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POWER CONSUMPTION MEASUREMENT ASSEMBLY AND METHOD, AND CHIP POWER C...
- Publication number 20220099741
- Publication date Mar 31, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Xinwang CHEN
- G01 - MEASURING TESTING
Information Patent Application
CURRENT TEST CIRCUIT, DEVICE AND METHOD, AND STORAGE MEDIUM
- Publication number 20220082619
- Publication date Mar 17, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Maosong MA
- G01 - MEASURING TESTING
Information Patent Application
TEST FIXTURE
- Publication number 20220057432
- Publication date Feb 24, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Maosong MA
- G01 - MEASURING TESTING