Xiping Yang

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Dallas, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Impedance analysis technique for frequency domain characterization...
- Patent number 7,912,661
- Issue date Mar 22, 2011
- KMG2 Sensors Corporation
- Kefeng Zeng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System/unit and method employing a plurality of magnetoelastic sens...
- Publication number 20080261261
- Publication date Oct 23, 2008
- KMG2 Sensors Corporation
- Craig A. Grimes
- G01 - MEASURING TESTING
Information Patent Application
Impedance analysis technique for frequency domain characterization...
- Publication number 20080071487
- Publication date Mar 20, 2008
- KMG2 Sensors Corporation
- Kefeng Zeng
- G01 - MEASURING TESTING