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Patents Grants
last 30 patents
Information
Patent Grant
Rapid measurement method for ultra-thin film optical constant
Patent number
11,662,197
Issue date
May 30, 2023
Huazhong University of Science & Technology
Honggang Gu
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring dielectric tensor of material
Patent number
11,644,413
Issue date
May 9, 2023
Huazhong University of Science & Technology
Honggang Gu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Snapshot type overlay error measuring device and measuring method
Patent number
11,619,883
Issue date
Apr 4, 2023
Huazhong University of Science & Technology
Xiuguo Chen
G01 - MEASURING TESTING
Information
Patent Grant
Optimization methods of polarization modulator and polarization mea...
Patent number
11,143,804
Issue date
Oct 12, 2021
Huazhong University of Science & Technology
Honggang Gu
G01 - MEASURING TESTING
Information
Patent Grant
Material optical transition analysis method and system
Patent number
10,983,007
Issue date
Apr 20, 2021
Huazhong University of Science & Technology
Honggang Gu
G01 - MEASURING TESTING
Information
Patent Grant
High temporal resolution Mueller matrix elliptical polarization mea...
Patent number
10,739,251
Issue date
Aug 11, 2020
Huazhong University of Science and Technology
Hao Jiang
G01 - MEASURING TESTING
Information
Patent Grant
Mueller-matrix microscope and measurement and calibration methods u...
Patent number
10,345,568
Issue date
Jul 9, 2019
WUHAN EOPTICS TECHNOLOGY CO., LTD.
Xiuguo Chen
G02 - OPTICS
Information
Patent Grant
Alignment method for optical axes of composite waveplate
Patent number
9,103,667
Issue date
Aug 11, 2015
Huazhong University of Science & Technology
Shiyuan Liu
G01 - MEASURING TESTING
Information
Patent Grant
Method for extracting critical dimension of semiconductor nanostruc...
Patent number
9,070,091
Issue date
Jun 30, 2015
Huazhong University of Science & Technology
Shiyuan Liu
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
SNAPSHOT TYPE OVERLAY ERROR MEASURING DEVICE AND MEASURING METHOD
Publication number
20220350261
Publication date
Nov 3, 2022
HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
Xiuguo Chen
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MEASURING DIELECTRIC TENSOR OF MATERIAL
Publication number
20210262922
Publication date
Aug 26, 2021
HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
Honggang GU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MATERIAL OPTICAL TRANSITION ANALYSIS METHOD AND SYSTEM
Publication number
20200333188
Publication date
Oct 22, 2020
HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
Honggang Gu
G01 - MEASURING TESTING
Information
Patent Application
RAPID MEASUREMENT METHOD FOR ULTRA-THIN FILM OPTICAL CONSTANT
Publication number
20200333132
Publication date
Oct 22, 2020
HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
Honggang Gu
G01 - MEASURING TESTING
Information
Patent Application
HIGH TEMPORAL RESOLUTION MUELLER MATRIX ELLIPTICAL POLARIZATION MEA...
Publication number
20190369006
Publication date
Dec 5, 2019
HUAZHONG UNIVERSITY OF SCIENCE & TECHNOLOGY
Hao JIANG
G01 - MEASURING TESTING
Information
Patent Application
POLARIZATION MODULATOR AND POLARIZATION MEASUREMENT SYSTEM
Publication number
20190361161
Publication date
Nov 28, 2019
HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
Honggang GU
G02 - OPTICS
Information
Patent Application
MUELLER-MATRIX MICROSCOPE
Publication number
20180164566
Publication date
Jun 14, 2018
Wuhan Eoptics Technology Co., Ltd.
Xiuguo CHEN
G02 - OPTICS
Information
Patent Application
ALIGNMENT METHOD FOR OPTICAL AXES OF COMPOSITE WAVEPLATE
Publication number
20150029507
Publication date
Jan 29, 2015
HUAZHONG UNIVERSITY OF SCIENCE & TECHNOLOGY
Shiyuan LIU
G02 - OPTICS
Information
Patent Application
METHOD FOR EXTRACTING CRITICAL DIMENSION OF SEMICONDUCTOR NANOSTRUC...
Publication number
20130325760
Publication date
Dec 5, 2013
HUAZHONG UNIVERSITY OF SCIENCE & TECHNOLOGY
Shiyuan LIU
G06 - COMPUTING CALCULATING COUNTING