Xiuhong Wei

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method for controlling a manufacturing apparatus and associated app...
- Patent number 11,669,017
- Issue date Jun 6, 2023
- ASML Netherlands B.V.
- Roy Werkman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Device manufacturing method
- Patent number 11,061,336
- Issue date Jul 13, 2021
- ASML Netherlands B.V.
- Hubertus Johannes Gertrudus Simons
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of applying a pattern to a substrate, device manufacturing m...
- Patent number 9,291,916
- Issue date Mar 22, 2016
- ASML Netherlands B.V.
- Stefan Cornelis Theodorus Van Der Sanden
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Alignment mark deformation estimating method, substrate position pr...
- Patent number 8,982,347
- Issue date Mar 17, 2015
- ASML Netherlands B.V.
- Xiuhong Wei
- G01 - MEASURING TESTING
Information Patent Grant
Method of applying a pattern to a substrate, device manufacturing m...
- Patent number 8,976,355
- Issue date Mar 10, 2015
- ASML Netherlands B.V.
- Stefan Cornelis Theodorus Van Der Sanden
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Alignment method, alignment system, and product with alignment mark
- Patent number 8,072,615
- Issue date Dec 6, 2011
- ASML Netherlands B.V.
- Sami Musa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
DETERMINING LITHOGRAPHIC MATCHING PERFORMANCE
- Publication number 20220334503
- Publication date Oct 20, 2022
- ASML NETHERLANDS B.V.
- Yingchao CUI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR CONTROLLING A MANUFACTURING APPARATUS AND ASSOCIATED APP...
- Publication number 20200278614
- Publication date Sep 3, 2020
- ASML NETHERLANDS B.V.
- Roy WERKMAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DEVICE MANUFACTURING METHOD
- Publication number 20200081353
- Publication date Mar 12, 2020
- ASML NETHERLANDS B.V.
- Hubertus Johannes Gertrudus SIMONS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of Applying a Pattern to a Substrate, Device Manufacturing M...
- Publication number 20150153656
- Publication date Jun 4, 2015
- ASML NETHERLANDS B.V.
- Stefan Cornelis Theodorus VAN DER SANDEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of Applying a Pattern to a Substrate, Device Manufacturing M...
- Publication number 20130230797
- Publication date Sep 5, 2013
- ASML NETHERLANDS B.V.
- Stefan Cornelis Theodorus VAN DER SANDEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Alignment Mark Deformation Estimating Method, Substrate Position Pr...
- Publication number 20130141723
- Publication date Jun 6, 2013
- ASML Netherlands N.V.
- Xiuhong WEI
- G01 - MEASURING TESTING
Information Patent Application
Alignment Measurement Arrangement, Alignment Measurement Method, De...
- Publication number 20100245792
- Publication date Sep 30, 2010
- ASML NETHERLANDS B.V.
- Franciscus Godefridus Casper BIJNEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Alignment Method, Alignment System, and Product with Alignment Mark
- Publication number 20090153861
- Publication date Jun 18, 2009
- ASML NETHERLANDS B.V.
- Sami MUSA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Xiuhong Wei

Person

Patents Grantslast 30 patents

Method for controlling a manufacturing apparatus and associated app...

Device manufacturing method

Method of applying a pattern to a substrate, device manufacturing m...

Alignment mark deformation estimating method, substrate position pr...

Method of applying a pattern to a substrate, device manufacturing m...

Alignment method, alignment system, and product with alignment mark

Patents Applicationslast 30 patents

DETERMINING LITHOGRAPHIC MATCHING PERFORMANCE

METHOD FOR CONTROLLING A MANUFACTURING APPARATUS AND ASSOCIATED APP...

DEVICE MANUFACTURING METHOD

Method of Applying a Pattern to a Substrate, Device Manufacturing M...

Method of Applying a Pattern to a Substrate, Device Manufacturing M...

Alignment Mark Deformation Estimating Method, Substrate Position Pr...

Alignment Measurement Arrangement, Alignment Measurement Method, De...

Alignment Method, Alignment System, and Product with Alignment Mark