Xu Ma

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Method for analyzing circuit pattern
- Patent number 8,890,084
- Issue date Nov 18, 2014
- United Microelectronics Corp.
- Bin Guo
- G01 - MEASURING TESTING
Information Patent Grant
Test pattern structure
- Patent number 7,989,804
- Issue date Aug 2, 2011
- United Microelectronics Corp.
- Da-Jiang Yang
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC

Patents Applicationslast 30 patents

Information Patent Application
TEST PATTERN STRUCTURE
- Publication number 20100227131
- Publication date Sep 9, 2010
- United Microelectronics Corp.
- Da-Jiang Yang
- H01 - BASIC ELECTRIC ELEMENTS