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Hangzhou, CN
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Patents Grants
last 30 patents
Information
Patent Grant
Addressable ring oscillator test chip
Patent number
10,156,605
Issue date
Dec 18, 2018
Semitronix Corporation
Weiwei Pan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Programmable addressable test chip
Patent number
9,646,900
Issue date
May 9, 2017
SEMITRONIX CORPORATION
Xu Ouyang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for testing a plurality of transistors in a target chip
Patent number
9,146,270
Issue date
Sep 29, 2015
SEMITRONIX CORPORATION
Kangpeng Shao
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ADDRESSABLE RING OSCILLATOR TEST CHIP
Publication number
20160061895
Publication date
Mar 3, 2016
Semitronix Corporation
Weiwei Pan
G01 - MEASURING TESTING
Information
Patent Application
PROGRAMMABLE ADDRESSABLE TEST CHIP
Publication number
20150212144
Publication date
Jul 30, 2015
Semitronix Corporation
XU OUYANG
G01 - MEASURING TESTING
Information
Patent Application
Method for Testing a Plurality of Transistors in a Target Chip
Publication number
20150002184
Publication date
Jan 1, 2015
Semitronix Corporation
Kangpeng Shao
G01 - MEASURING TESTING