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Hopewell Junction, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
LCR test circuit structure for detecting metal gate defect conditions
Patent number
9,780,007
Issue date
Oct 3, 2017
GLOBALFOUNDRIES Inc.
Xu Ouyang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Modularized three-dimensional capacitor array
Patent number
8,790,989
Issue date
Jul 29, 2014
International Business Machines Corporation
Louis L. Hsu
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Flash memory structure with enhanced capacitive coupling coefficien...
Patent number
8,759,175
Issue date
Jun 24, 2014
International Business Machines Corporation
Louis C. Hsu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Noncontact electrical testing with optical techniques
Patent number
8,742,782
Issue date
Jun 3, 2014
International Business Machines Corporation
Xu Ouyang
G01 - MEASURING TESTING
Information
Patent Grant
Modularized three-dimensional capacitor array
Patent number
8,487,696
Issue date
Jul 16, 2013
International Business Machines Corporation
Louis L. Hsu
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Wafer alignment system with optical coherence tomography
Patent number
8,489,225
Issue date
Jul 16, 2013
International Business Machines Corporation
Yongchun Xin
G01 - MEASURING TESTING
Information
Patent Grant
Method for compensating for tool processing variation in the routin...
Patent number
8,369,976
Issue date
Feb 5, 2013
International Business Machines Corporation
Keith Kwong Hon Wong
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Placement and optimization of process dummy cells
Patent number
8,347,246
Issue date
Jan 1, 2013
International Business Machines Corporation
Xu Ouyang
G11 - INFORMATION STORAGE
Information
Patent Grant
Dual beta ratio SRAM
Patent number
8,339,893
Issue date
Dec 25, 2012
International Business Machines Corporation
Yuen H. Chan
G11 - INFORMATION STORAGE
Information
Patent Grant
Detecting asymmetrical transistor leakage defects
Patent number
8,294,485
Issue date
Oct 23, 2012
International Business Machines Corporation
Xu Ouyang
G11 - INFORMATION STORAGE
Information
Patent Grant
Placement and optimization of process dummy cells
Patent number
8,225,255
Issue date
Jul 17, 2012
International Business Machines Corporation
Xu Ouyang
G11 - INFORMATION STORAGE
Information
Patent Grant
Flash memory structure with enhanced capacitive coupling coefficien...
Patent number
8,193,575
Issue date
Jun 5, 2012
International Business Machines Corporation
Louis C. Hsu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Modularized three-dimensional capacitor array
Patent number
8,188,786
Issue date
May 29, 2012
International Business Machines Corporation
Louis L. Hsu
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Inline low-damage automated failure analysis
Patent number
8,111,903
Issue date
Feb 7, 2012
International Business Machines Corporation
Steven B. Herschbein
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Geometry based electrical hotspot detection in integrated circuit l...
Patent number
8,108,803
Issue date
Jan 31, 2012
International Business Machines Corporation
Fook-Luen Heng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for optimizing the routing of wafers/lots based on yield
Patent number
8,095,230
Issue date
Jan 10, 2012
International Business Machines Corporation
Xu Ouyang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
SRAM device, and SRAM device design structure, with adaptable acces...
Patent number
8,009,461
Issue date
Aug 30, 2011
International Business Machines Corporation
Xu Ouyang
G11 - INFORMATION STORAGE
Information
Patent Grant
Multidimensional process window optimization in semiconductor manuf...
Patent number
7,962,234
Issue date
Jun 14, 2011
International Business Machines Corporation
Yunsheng Song
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Computer program product for excluding variations attributable to e...
Patent number
7,953,680
Issue date
May 31, 2011
International Business Machines Corporation
Xu Ouyang
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Defect-free hybrid orientation technology for semiconductor devices
Patent number
7,790,522
Issue date
Sep 7, 2010
International Business Machines Corporation
Louis C. Hsu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Defect-free hybrid orientation technology for semiconductor devices
Patent number
7,777,306
Issue date
Aug 17, 2010
International Business Machines Corporation
Louis C. Hsu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Process for making a MCSFET
Patent number
7,682,913
Issue date
Mar 23, 2010
International Business Machines Corporation
Xu Ouyang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of adaptively selecting chips for reducing in-line testing i...
Patent number
7,682,842
Issue date
Mar 23, 2010
International Business Machines Corporation
Rao H. Desineni
G01 - MEASURING TESTING
Information
Patent Grant
Method to determine the root causes of failure patterns by using sp...
Patent number
7,676,775
Issue date
Mar 9, 2010
International Business Machines Corporation
Howard Chen
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory array peripheral structures and use
Patent number
7,515,502
Issue date
Apr 7, 2009
International Business Machines Corporation
Ishtiaq Ahsan
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
MODULARIZED THREE-DIMENSIONAL CAPACITOR ARRAY
Publication number
20130260530
Publication date
Oct 3, 2013
International Business Machines Corporation
Louis L. Hsu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LCR TEST CIRCUIT STRUCTURE FOR DETECTING METAL GATE DEFECT CONDITIONS
Publication number
20130169308
Publication date
Jul 4, 2013
International Business Machines Corporation
Xu Ouyang
G01 - MEASURING TESTING
Information
Patent Application
NONCONTACT ELECTRICAL TESTING WITH OPTICAL TECHNIQUES
Publication number
20130027051
Publication date
Jan 31, 2013
International Business Machines Corporation
Xu Ouyang
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR DEFECT-BITMAP-FAIL PATTERNS MATCHING ANALYSIS...
Publication number
20130016895
Publication date
Jan 17, 2013
International Business Machines Corporation
Zhigang Song
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
WAFER ALIGNMENT SYSTEM WITH OPTICAL COHERENCE TOMOGRAPHY
Publication number
20120232686
Publication date
Sep 13, 2012
International Business Machines Corporation
Yongchun Xin
G01 - MEASURING TESTING
Information
Patent Application
PLACEMENT AND OPTIMIZATION OF PROCESS DUMMY CELLS
Publication number
20120192137
Publication date
Jul 26, 2012
International Business Machines Corporation
Xu Ouyang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MODULARIZED THREE-DIMENSIONAL CAPACITOR ARRAY
Publication number
20120188002
Publication date
Jul 26, 2012
International Business Machines Corporation
Louis L. Hsu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FLASH MEMORY STRUCTURE WITH ENHANCED CAPACITIVE COUPLING COEFFICIEN...
Publication number
20120184076
Publication date
Jul 19, 2012
International Business Machines Corporation
Louis C. Hsu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
GEOMETRY BASED ELECTRICAL HOTSPOT DETECTION IN INTEGRATED CIRCUIT L...
Publication number
20110099529
Publication date
Apr 28, 2011
International Business Machines Corporation
Fook-Luen Heng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Dual Beta Ratio SRAM
Publication number
20110075504
Publication date
Mar 31, 2011
International Business Machines Corporation
Yuen H. Chan
G11 - INFORMATION STORAGE
Information
Patent Application
MODULARIZED THREE-DIMENSIONAL CAPACITOR ARRAY
Publication number
20110069425
Publication date
Mar 24, 2011
International Business Machines Corporation
Louis L. Hsu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DETECTING ASYMMETRICAL TRANSISTOR LEAKAGE DEFECTS
Publication number
20100201376
Publication date
Aug 12, 2010
International Business Machines Corporation
Xu Ouyang
G11 - INFORMATION STORAGE
Information
Patent Application
INLINE LOW-DAMAGE AUTOMATED FAILURE ANALYSIS
Publication number
20100080446
Publication date
Apr 1, 2010
International Business Machines Corporation
Steven B. Herschbein
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR OPTIMIZING THE ROUTING OF WAFERS/LOTS BASED ON YIELD
Publication number
20090317924
Publication date
Dec 24, 2009
International Business Machines Corporation
Xu Ouyang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR COMPENSATING FOR TOOL PROCESSING VARIATION IN THE ROUTIN...
Publication number
20090319074
Publication date
Dec 24, 2009
International Business Machines Corporation
Keith Kwong Hon Wong
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTIDIMENSIONAL PROCESS WINDOW OPTIMIZATION IN SEMICONDUCTOR MANUF...
Publication number
20090306807
Publication date
Dec 10, 2009
International Business Machines Corporation
Yunsheng Song
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEFECT-FREE HYBRID ORIENTATION TECHNOLOGY FOR SEMICONDUCTOR DEVICES
Publication number
20090305472
Publication date
Dec 10, 2009
Louis C. Hsu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of Adaptively Selecting Chips for Reducing In-line Testing i...
Publication number
20090299679
Publication date
Dec 3, 2009
International Business Machines Corporation
RAO H. DESINENI
G01 - MEASURING TESTING
Information
Patent Application
PLACEMENT AND OPTIMIZATION OF PROCESS DUMMY CELLS
Publication number
20090290401
Publication date
Nov 26, 2009
International Business Machines Corporation
Xu Ouyang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FLASH MEMORY STRUCTURE WITH ENHANCED CAPACITIVE COUPLING COEFFICIEN...
Publication number
20090200598
Publication date
Aug 13, 2009
International Business Machines Corporation
Louis C. Hsu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SRAM DEVICE, AND SRAM DEVICE DESIGN STRUCTURE, WITH ADAPTABLE ACCES...
Publication number
20090175068
Publication date
Jul 9, 2009
International Business Machines Corporation
Xu Ouyang
G11 - INFORMATION STORAGE
Information
Patent Application
METHODS AND COMPUTER PROGRAM PRODUCTS FOR EXCLUDING VARIATIONS ATTR...
Publication number
20090150811
Publication date
Jun 11, 2009
International Business Machines Corporation
Xu Ouyang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEMORY ARRAY PERIPHERAL STRUCTURES AND USE
Publication number
20090073796
Publication date
Mar 19, 2009
International Business Machines Corporation
Ishtiaq Ahsan
G11 - INFORMATION STORAGE
Information
Patent Application
Method to Determine the Root Causes of Failure Patterns by Using Sp...
Publication number
20080301597
Publication date
Dec 4, 2008
International Business Machines Corporation
Howard Chen
G01 - MEASURING TESTING
Information
Patent Application
TEST STRUCTURES AND METHODOLOGY FOR DETECTING HOT DEFECTS
Publication number
20080286888
Publication date
Nov 20, 2008
International Business Machines Corporation
Louis Lu-Chen Hsu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEFECT-FREE HYBRID ORIENTATION TECHNOLOGY FOR SEMICONDUCTOR DEVICES
Publication number
20080220280
Publication date
Sep 11, 2008
Louis C. Hsu
H01 - BASIC ELECTRIC ELEMENTS