Xu XIE

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Troy, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for plasma-induced terahertz spectroscopy
- Patent number 8,134,128
- Issue date Mar 13, 2012
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for generating amplified terahertz radiation fo...
- Patent number 7,718,969
- Issue date May 18, 2010
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for plasma-induced terahertz spectroscopy
- Patent number 7,652,253
- Issue date Jan 26, 2010
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for the enhancement of terahertz wave generatio...
- Patent number 7,595,491
- Issue date Sep 29, 2009
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Method of analyzing a remotely-located object utilizing an optical...
- Patent number 7,531,802
- Issue date May 12, 2009
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR PLASMA-INDUCED TERAHERTZ SPECTROSCOPY
- Publication number 20100277718
- Publication date Nov 4, 2010
- Rensselaer Polytechnic Institute
- XI-Cheng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR PLASMA-INDUCED TERAHERTZ SPECTROSCOPY
- Publication number 20080203306
- Publication date Aug 28, 2008
- Rensselaer Polytechnic Institute
- XI-Cheng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR GENERATING AMPLIFIED TERAHERTZ RADIATION FO...
- Publication number 20080048122
- Publication date Feb 28, 2008
- Rensselaer Polytechnic Institute
- XI-Cheng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR THE ENHANCEMENT OF TERAHERTZ WAVE GENERATIO...
- Publication number 20070263682
- Publication date Nov 15, 2007
- Rensselaer Polytechnic Institute
- XI-Cheng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ANALYZING A REMOTELY-LOCATED OBJECT UTILIZING AN OPTICAL...
- Publication number 20070145276
- Publication date Jun 28, 2007
- Rensselaer Polytechnic Institute
- XI-Cheng ZHANG
- G02 - OPTICS