Xu Zhang

Person

Hayward, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam detection unit with multi type detection subu...
- Patent number 8,350,213
- Issue date Jan 8, 2013
- Hermes Microvision Inc.
- Joe Wang
- G01 - MEASURING TESTING
Information Patent Grant
Electron gun with magnetic immersion double condenser lenses
- Patent number 8,314,401
- Issue date Nov 20, 2012
- Hermes-Microvision, Inc.
- Xu Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for a charged particle beam
- Patent number 8,164,060
- Issue date Apr 24, 2012
- Hermes-Microvision, Inc.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle system including segmented detection elements
- Patent number 7,928,383
- Issue date Apr 19, 2011
- Hermes-Microvision, Inc.
- Joe Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun with magnetic immersion double condenser lenses
- Patent number 7,893,406
- Issue date Feb 22, 2011
- Hermes-Microvision, Inc.
- Xu Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detection devices
- Patent number 7,872,236
- Issue date Jan 18, 2011
- Hermes Microvision, Inc.
- Xu Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for a charged particle beam
- Patent number 7,825,386
- Issue date Nov 2, 2010
- Hermes-Microvision, Inc.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus
- Patent number 7,759,653
- Issue date Jul 20, 2010
- Hermes-Microvision, Inc.
- Zhong-Wei Chen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Detection Unit with Multi Type Detection Subu...
- Publication number 20110215241
- Publication date Sep 8, 2011
- Hermes Microvision, Inc.
- Joe Wang
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON GUN WITH MAGNETIC IMMERSION DOUBLE CONDENSER LENSES
- Publication number 20110018470
- Publication date Jan 27, 2011
- Hermes-Microvision, Inc.
- Xu Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR A CHARGED PARTICLE BEAM
- Publication number 20100270468
- Publication date Oct 28, 2010
- Hermes-Microvision, Inc.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM APPARATUS
- Publication number 20090294664
- Publication date Dec 3, 2009
- Hermes-Microvision, Inc.
- Zhong-Wei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DETECTION DEVICES
- Publication number 20090090866
- Publication date Apr 9, 2009
- HERMES MICROVISION, INC., TAIWAN
- Xu ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DETECTION DEVICES
- Publication number 20080315094
- Publication date Dec 25, 2008
- Joe WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR A CHARGED PARTICLE BEAM
- Publication number 20080121810
- Publication date May 29, 2008
- Hermes-Microvision, Inc.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Charged particle beam detection unit with multi type detection subu...

Electron gun with magnetic immersion double condenser lenses

System and method for a charged particle beam

Charged particle system including segmented detection elements

Electron gun with magnetic immersion double condenser lenses

Charged particle detection devices

System and method for a charged particle beam

Electron beam apparatus

Patents Applicationslast 30 patents

Charged Particle Beam Detection Unit with Multi Type Detection Subu...

ELECTRON GUN WITH MAGNETIC IMMERSION DOUBLE CONDENSER LENSES

SYSTEM AND METHOD FOR A CHARGED PARTICLE BEAM

ELECTRON BEAM APPARATUS

CHARGED PARTICLE DETECTION DEVICES

CHARGED PARTICLE DETECTION DEVICES

SYSTEM AND METHOD FOR A CHARGED PARTICLE BEAM