Xuan Li

Person

Shanghai, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Method of manufacturing a semiconductor structure by forming a mask...
- Patent number 11,587,836
- Issue date Feb 21, 2023
- Semiconductor Manufacturing International (Shanghai) Corporation
- Song Bai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect inspection method and apparatus using micro lens matrix
- Patent number 11,085,884
- Issue date Aug 10, 2021
- Semiconductor Manufacturing International (Shanghai) Corporation
- Qiang Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for connecting users based on a measure of correl...
- Patent number 10,990,417
- Issue date Apr 27, 2021
- Autodesk, Inc.
- Ling Zhi Zhao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection method and apparatus using micro lens matrix
- Patent number 10,416,091
- Issue date Sep 17, 2019
- Semiconductor Manufacturing International (Shanghai) Corporation
- Qiang Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for rapid uplink air interface synchronization
- Patent number 8,259,777
- Issue date Sep 4, 2012
- Adaptix, Inc.
- Xuan Li
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
GENERATING RULES FOR PREDICTING CHARACTERISTICS OF COMPUTER OPERATIONS
- Publication number 20240394565
- Publication date Nov 28, 2024
- PAYPAL, INC.
- Xuan Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR STRUCTURE AND FABRICATION METHOD THEREOF
- Publication number 20210090960
- Publication date Mar 25, 2021
- Semiconductor Manufacturing International (Shanghai) Corporation
- Song BAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT INSPECTION METHOD AND APPARATUS USING MICRO LENS MATRIX
- Publication number 20190346377
- Publication date Nov 14, 2019
- Semiconductor Manufacturing International (Shanghai) Corporation
- Qiang Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION METHOD AND APPARATUS USING MICRO LENS MATRIX
- Publication number 20180080883
- Publication date Mar 22, 2018
- Semiconductor Manufacturing International (Shanghai) Corporation
- Qiang Wu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CONNECTING USERS BASED ON A MEASURE OF CORREL...
- Publication number 20140068086
- Publication date Mar 6, 2014
- Ling Zhi ZHAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and methods for rapid uplink air interface synchronization
- Publication number 20080130766
- Publication date Jun 5, 2008
- Adaptix, Inc.
- Xuan Li
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Person

Patents Grantslast 30 patents

Method of manufacturing a semiconductor structure by forming a mask...

Defect inspection method and apparatus using micro lens matrix

Method and system for connecting users based on a measure of correl...

Defect inspection method and apparatus using micro lens matrix

Systems and methods for rapid uplink air interface synchronization

Patents Applicationslast 30 patents

GENERATING RULES FOR PREDICTING CHARACTERISTICS OF COMPUTER OPERATIONS

SEMICONDUCTOR STRUCTURE AND FABRICATION METHOD THEREOF

DEFECT INSPECTION METHOD AND APPARATUS USING MICRO LENS MATRIX

DEFECT INSPECTION METHOD AND APPARATUS USING MICRO LENS MATRIX

METHOD AND SYSTEM FOR CONNECTING USERS BASED ON A MEASURE OF CORREL...

Systems and methods for rapid uplink air interface synchronization