Xuejing Che

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Test system and method of testing a wafer for integrated circuit de...
- Patent number 10,823,759
- Issue date Nov 3, 2020
- Xilinx, Inc.
- Lik Huay Lim
- G01 - MEASURING TESTING
Information Patent Grant
Method of assigning contact elements associated with an integrated...
- Patent number 10,783,308
- Issue date Sep 22, 2020
- Xilinix, Inc.
- Lik Huay Lim
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
TEST SYSTEM AND METHOD OF TESTING A WAFER FOR INTEGRATED CIRCUIT DE...
- Publication number 20200141976
- Publication date May 7, 2020
- Xilinx, Inc.
- Lik Huay Lim
- G01 - MEASURING TESTING