Membership
Tour
Register
Log in
Xuepeng Cao
Follow
Person
Beijing, CN
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Photodiode device, photodiode detector and methods of fabricating t...
Patent number
11,189,741
Issue date
Nov 30, 2021
Nuctech Company Limited
Lan Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Photodiode device and photodiode detector
Patent number
11,011,656
Issue date
May 18, 2021
Nuctech Company Limited
Lan Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor detector and method for packaging the same
Patent number
10,670,743
Issue date
Jun 2, 2020
Nuctech Company Limited
Lan Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Apparatuses for processing signals for a plurality of energy region...
Patent number
10,663,607
Issue date
May 26, 2020
Nuctech Company Limited
Lan Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor detector
Patent number
10,388,818
Issue date
Aug 20, 2019
Nuctech Company Limited
Lan Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor detector
Patent number
10,295,679
Issue date
May 21, 2019
Nuctech Company Limited
Lan Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor detector
Patent number
10,101,473
Issue date
Oct 16, 2018
Nuctech Company Limited
Lan Zhang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PHOTODIODE DEVICE, PHOTODIODE DETECTOR AND METHODS OF FABRICATING T...
Publication number
20190334045
Publication date
Oct 31, 2019
Nuctech Company Limited
Lan ZHANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PHOTODIODE DEVICE AND PHOTODIODE DETECTOR
Publication number
20190326458
Publication date
Oct 24, 2019
Nuctech Company Limited
Lan ZHANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DETECTOR AND METHOD FOR PACKAGING THE SAME
Publication number
20180059265
Publication date
Mar 1, 2018
Nuctech Company Limited
Lan Zhang
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DETECTOR
Publication number
20180059261
Publication date
Mar 1, 2018
Nuctech Company Limited
Lan Zhang
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DETECTOR
Publication number
20180059262
Publication date
Mar 1, 2018
Nuctech Company Limited
Lan Zhang
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DETECTOR
Publication number
20180062021
Publication date
Mar 1, 2018
Nuctech Company Limited
Lan Zhang
G01 - MEASURING TESTING
Information
Patent Application
APPARATUSES FOR PROCESSING SIGNALS FOR A PLURALITY OF ENERGY REGION...
Publication number
20180059269
Publication date
Mar 1, 2018
Nuctech Company Limited
Lan Zhang
G01 - MEASURING TESTING
Information
Patent Application
DETECTOR, AND DETECTING SYSTEM AND METHOD FOR DIVIDING ENERGY REGIO...
Publication number
20180059264
Publication date
Mar 1, 2018
Nuctech Company Limited
Lan Zhang
G01 - MEASURING TESTING