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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Replaceable module for a charged particle apparatus
Patent number
11,961,698
Issue date
Apr 16, 2024
ASML Netherlands B.V.
Christiaan Otten
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus using charged particle beams
Patent number
11,961,697
Issue date
Apr 16, 2024
ASML Netherlands B.V.
Xuerang Hu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus of plural charged-particle beams
Patent number
11,887,807
Issue date
Jan 30, 2024
ASML Netherlands B.V.
Weiming Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multiple charged-particle beam apparatus and methods
Patent number
11,854,765
Issue date
Dec 26, 2023
ASML Netherlands B.V.
Weiming Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus using multiple beams of charged particles
Patent number
11,804,356
Issue date
Oct 31, 2023
ASML Netherlands B.V.
Xuerang Hu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-beam inspection apparatus with improved detection performance...
Patent number
11,721,521
Issue date
Aug 8, 2023
ASML Netherlands B.V.
Weiming Ren
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Apparatus of plural charged-particle beams
Patent number
11,705,304
Issue date
Jul 18, 2023
ASML Netherlands B.V.
Shuai Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus of plural charged particle beams
Patent number
11,676,793
Issue date
Jun 13, 2023
ASML Netherlands B.V.
Weiming Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus using charged particle beams
Patent number
11,670,477
Issue date
Jun 6, 2023
ASML Netherlands B.V.
Xuerang Hu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for aligning electron beams in multi-beam inspect...
Patent number
11,614,416
Issue date
Mar 28, 2023
ASML Netherlands B.V.
Xuerang Hu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-beam inspection apparatus with single-beam mode
Patent number
11,594,396
Issue date
Feb 28, 2023
ASML Netherlands B.V.
Weiming Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus of plural charged-particle beams
Patent number
11,587,758
Issue date
Feb 21, 2023
ASML Netherlands B.V.
Weiming Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-beam inspection apparatus
Patent number
11,538,655
Issue date
Dec 27, 2022
ASML Netherlands B.V.
Xuerang Hu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multiple charged-particle beam apparatus with low crosstalk
Patent number
11,469,074
Issue date
Oct 11, 2022
ASML Netherlands B.V.
Weiming Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus of plural charged-particle beams
Patent number
11,398,368
Issue date
Jul 26, 2022
ASML Netherlands B.V.
Weiming Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods for compensating dispersion of a beam separator...
Patent number
11,328,894
Issue date
May 10, 2022
ASML Netherlands B.V.
Weiming Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus for multiple charged-particle beams
Patent number
11,302,514
Issue date
Apr 12, 2022
ASML Netherlands B.V.
Weiming Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus using multiple beams of charged particles
Patent number
11,289,304
Issue date
Mar 29, 2022
ASML Netherlands B.V.
Xuerang Hu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-beam inspection apparatus with improved detection performance...
Patent number
11,282,675
Issue date
Mar 22, 2022
ASML Netherlands B.V.
Weiming Ren
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Multi-beam inspection apparatus
Patent number
11,232,928
Issue date
Jan 25, 2022
ASML Netherlands B.V.
Weiming Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-cell detector for charged particles
Patent number
11,222,766
Issue date
Jan 11, 2022
ASML Netherlands B.V.
Joe Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus of plural charged-particle beams
Patent number
11,062,877
Issue date
Jul 13, 2021
ASML Netherlands B.V.
Shuai Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus using multiple charged particle beams
Patent number
11,062,874
Issue date
Jul 13, 2021
ASML Netherlands B.V.
Weiming Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-beam inspection apparatus with improved detection performance...
Patent number
10,892,138
Issue date
Jan 12, 2021
ASML Netherlands B.V.
Weiming Ren
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Apparatus of plural charged-particle beams
Patent number
10,879,031
Issue date
Dec 29, 2020
ASML Netherlands B.V.
Weiming Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-beam inspection apparatus
Patent number
10,879,032
Issue date
Dec 29, 2020
ASML Netherlands B.V.
Xuerang Hu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus of plural charged-particle beams
Patent number
10,811,222
Issue date
Oct 20, 2020
ASML Netherlands B.V.
Weiming Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus of plural charged-particle beams
Patent number
10,541,110
Issue date
Jan 21, 2020
ASML Netherlands B.V.
Shuai Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus of plural charged-particle beams
Patent number
10,395,886
Issue date
Aug 27, 2019
ASML Netherlands B.V.
Weiming Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus of plural charged-particle beams
Patent number
10,141,160
Issue date
Nov 27, 2018
Hermes-Microvision, Inc.
Weiming Ren
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
MULTIPLE CHARGED-PARTICLE BEAM APPARATUS AND METHODS
Publication number
20240145214
Publication date
May 2, 2024
ASML NETHERLANDS B.V.
Weiming REN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
Publication number
20240128044
Publication date
Apr 18, 2024
ASML NETHERLANDS B.V.
Weiming REN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS USING MULTIPLE BEAMS OF CHARGED PARTICLES
Publication number
20240071711
Publication date
Feb 29, 2024
ASML NETHERLANDS B.V.
Xuerang HU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
Publication number
20240014003
Publication date
Jan 11, 2024
ASML NETHERLANDS B.V.
Shuai Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS USING CHARGED PARTICLE BEAMS
Publication number
20230411110
Publication date
Dec 21, 2023
ASML NETHERLANDS B.V.
Xuerang HU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SAMPLE PRE-CHARGING METHODS AND APPARATUSES FOR CHARGED PARTICLE BE...
Publication number
20230360877
Publication date
Nov 9, 2023
ASML NETHERLANDS B.V.
Xuedong LIU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR ALIGNING ELECTRON BEAMS IN MULTI-BEAM INSPECT...
Publication number
20230280293
Publication date
Sep 7, 2023
ASML NETHERLANDS B.V.
Xuerang HU
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
Publication number
20230282441
Publication date
Sep 7, 2023
ASML NETHERLANDS B.V.
Weiming REN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
REPLACEABLE MODULE FOR A CHARGED PARTICLE APPARATUS
Publication number
20230107989
Publication date
Apr 6, 2023
ASML NETHERLANDS B.V.
Christiaan OTTEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTIPLE CHARGED-PARTICLE BEAM APPARATUS WITH LOW CROSSTALK
Publication number
20230020194
Publication date
Jan 19, 2023
ASML NETHERLANDS B.V.
Weiming REN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI-BEAM INSPECTION APPARATUS WITH IMPROVED DETECTION PERFORMANCE...
Publication number
20220319808
Publication date
Oct 6, 2022
ASML NETHERLANDS B.V.
Weiming REN
B82 - NANO-TECHNOLOGY
Information
Patent Application
SYSTEMS AND METHODS FOR COMPENSATING DISPERSION OF A BEAM SEPARATOR...
Publication number
20220262594
Publication date
Aug 18, 2022
ASML NETHERLANDS B.V.
Weiming REN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS FOR MULTIPLE CHARGED-PARTICLE BEAMS
Publication number
20220246395
Publication date
Aug 4, 2022
ASML NETHERLANDS B.V.
Weiming REN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS USING MULTIPLE BEAMS OF CHARGED PARTICLES
Publication number
20220223366
Publication date
Jul 14, 2022
ASML NETHERLANDS B.V.
Xuerang HU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI-BEAM INSPECTION APPARATUS
Publication number
20220216029
Publication date
Jul 7, 2022
ASML NETHERLANDS B.V.
Weiming REN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS USING MULTIPLE CHARGED PARTICLE BEAMS
Publication number
20220005665
Publication date
Jan 6, 2022
ASML NETHERLANDS B.V.
Weiming REN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
REPLACEABLE MODULE FOR A CHARGED PARTICLE APPARATUS
Publication number
20210391139
Publication date
Dec 16, 2021
ASML NETHERLANDS B.V.
Christiaan OTTEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
Publication number
20210384008
Publication date
Dec 9, 2021
ASML NETHERLANDS B.V.
Shuai Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
Publication number
20210233736
Publication date
Jul 29, 2021
ASML Netherlands B.V.
Weiming REN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
Publication number
20210193433
Publication date
Jun 24, 2021
ASML NETHERLANDS B.V.
Weiming REN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTIPLE CHARGED-PARTICLE BEAM APPARATUS WITH LOW CROSSTALK
Publication number
20210193437
Publication date
Jun 24, 2021
ASML NETHERLANDS B.V.
Weiming REN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI-BEAM INSPECTION APPARATUS WITH IMPROVED DETECTION PERFORMANCE...
Publication number
20210151291
Publication date
May 20, 2021
ASML NETHERLANDS B.V.
Weiming REN
B82 - NANO-TECHNOLOGY
Information
Patent Application
MULTI-BEAM INSPECTION APPARATUS
Publication number
20210151280
Publication date
May 20, 2021
ASML NETHERLANDS B.V.
Xuerang HU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTIPLE CHARGED-PARTICLE BEAM APPARATUS AND METHODS OF OPERATING T...
Publication number
20200381212
Publication date
Dec 3, 2020
ASML Netherlands B.V.
Weiming REN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTIPLE CHARGED-PARTICLE BEAM APPARATUS WITH LOW CROSSTALK
Publication number
20200381207
Publication date
Dec 3, 2020
ASML Netherlands B.V.
Weiming REN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTIPLE CHARGED-PARTICLE BEAM APPARATUS AND METHODS
Publication number
20200381211
Publication date
Dec 3, 2020
ASML Netherlands B.V.
Weiming REN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI-BEAM INSPECTION APPARATUS WITH SINGLE-BEAM MODE
Publication number
20200321191
Publication date
Oct 8, 2020
ASML NETHERLANDS B.V.
Weiming REN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
AN APPARATUS USING CHARGED PARTICLE BEAMS
Publication number
20200303155
Publication date
Sep 24, 2020
ASML NETHERLANDS B.V.
Xuerang HU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI-CELL DETECTOR FOR CHARGED PARTICLES
Publication number
20200286708
Publication date
Sep 10, 2020
ASML NETHERLANDS B.V.
Joe WANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SAMPLE PRE-CHARGING METHODS AND APPARATUSES FOR CHARGED PARTICLE BE...
Publication number
20200266023
Publication date
Aug 20, 2020
ASML NETHERLANDS B.V.
Xuedong LIU
H01 - BASIC ELECTRIC ELEMENTS