Xuguang Jiang

Person

Milpitas, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Alignment of a specimen for inspection and other processes
- Patent number 11,748,871
- Issue date Sep 5, 2023
- KLA Corp.
- Xuguang Jiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Variation-based segmentation for wafer defect detection
- Patent number 11,676,260
- Issue date Jun 13, 2023
- KLA Corporation
- Xuguang Jiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Projection and distance segmentation algorithm for wafer defect det...
- Patent number 11,610,296
- Issue date Mar 21, 2023
- KLA Corporation
- Xuguang Jiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for wafer inspection with a noise boundary threshold
- Patent number 10,533,953
- Issue date Jan 14, 2020
- KLA-Tencor Corporation
- Xuguang Jiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect detection on transparent or translucent wafers
- Patent number 10,402,963
- Issue date Sep 3, 2019
- KLA-Tencor Corporation
- Xuguang Jiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for defocus detection
- Patent number 10,372,113
- Issue date Aug 6, 2019
- KLA-Tencor Corporation
- Xuguang Jiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for monitoring a non-defect related characteris...
- Patent number 10,324,046
- Issue date Jun 18, 2019
- KLA-Tencor Corp.
- Tao-Yi Fu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System, method and computer program product for identifying fabrica...
- Patent number 10,043,265
- Issue date Aug 7, 2018
- KLA-Tencor Corporation
- Tong Huang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Alignment of a Specimen for Inspection and Other Processes
- Publication number 20220101506
- Publication date Mar 31, 2022
- KLA Corporation
- Xuguang Jiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROJECTION AND DISTANCE SEGMENTATION ALGORITHM FOR WAFER DEFECT DET...
- Publication number 20210217159
- Publication date Jul 15, 2021
- KLA Corporation
- Xuguang Jiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VARIATION-BASED SEGMENTATION FOR WAFER DEFECT DETECTION
- Publication number 20210097671
- Publication date Apr 1, 2021
- KLA Corporation
- Xuguang Jiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT DETECTION ON TRANSPARENT OR TRANSLUCENT WAFERS
- Publication number 20190066284
- Publication date Feb 28, 2019
- KLA-Tencor Corporation
- Xuguang Jiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Defocus Detection
- Publication number 20180088560
- Publication date Mar 29, 2018
- KLA-Tencor Corporation
- Xuguang Jiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Wafer Inspection with a Noise Boundary Threshold
- Publication number 20170284944
- Publication date Oct 5, 2017
- KLA-Tencor Corporation
- Xuguang Jiang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR IDENTIFYING FABRICA...
- Publication number 20170270652
- Publication date Sep 21, 2017
- KLA-Tencor Corporation
- Tong Huang
- G06 - COMPUTING CALCULATING COUNTING

Xuguang Jiang

Person

Patents Grantslast 30 patents

Alignment of a specimen for inspection and other processes

Variation-based segmentation for wafer defect detection

Projection and distance segmentation algorithm for wafer defect det...

System and method for wafer inspection with a noise boundary threshold

Defect detection on transparent or translucent wafers

Method for defocus detection

Methods and systems for monitoring a non-defect related characteris...

System, method and computer program product for identifying fabrica...

Patents Applicationslast 30 patents

Alignment of a Specimen for Inspection and Other Processes

PROJECTION AND DISTANCE SEGMENTATION ALGORITHM FOR WAFER DEFECT DET...

VARIATION-BASED SEGMENTATION FOR WAFER DEFECT DETECTION

DEFECT DETECTION ON TRANSPARENT OR TRANSLUCENT WAFERS

Method for Defocus Detection

System and Method for Wafer Inspection with a Noise Boundary Threshold

SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR IDENTIFYING FABRICA...