Xuming MA

Person

Beijing, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Security inspection apparatus and method of controlling the same
- Patent number 12,164,023
- Issue date Dec 10, 2024
- Tsinghua University
- Zhiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz mixer, method of manufacturing terahertz mixer, and elect...
- Patent number 12,149,014
- Issue date Nov 19, 2024
- Nuctech Company Limited
- Yuanjing Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Security inspection apparatus and method of controlling the same
- Patent number 12,007,523
- Issue date Jun 11, 2024
- Tsinghua University
- Ziran Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz detector and method of manufacturing terahertz detector
- Patent number 12,004,426
- Issue date Jun 4, 2024
- Nuctech Company Limited
- Ziran Zhao
Information Patent Grant
Portable terahertz security inspection apparatus
- Patent number 11,733,422
- Issue date Aug 22, 2023
- Nuctech Company Limited
- Ziran Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz security inspection robot
- Patent number 11,662,457
- Issue date May 30, 2023
- Tsinghua University
- Zhiqiang Chen
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Terahertz detector
- Patent number 10,775,302
- Issue date Sep 15, 2020
- Nuctech Company Limited
- Ziran Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for processing signals of semiconductor detector
- Patent number 9,835,739
- Issue date Dec 5, 2017
- Tsinghua University
- Lan Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF MANUFACTURING TERAHERTZ DETECTION DEVICE, AND DETECTION A...
- Publication number 20230154942
- Publication date May 18, 2023
- Nuctech Company Limited
- Ziran ZHAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROMAGNETIC IMAGING DEVICE FOR ACTIVE MICROWAVE AND MILLIMETER...
- Publication number 20220221576
- Publication date Jul 14, 2022
- Tsinghua Park
- Ziran Zhao
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ DETECTOR AND METHOD OF MANUFACTURING TERAHERTZ DETECTOR
- Publication number 20220115576
- Publication date Apr 14, 2022
- Nuctech Company Limited
- Ziran ZHAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TERAHERTZ MIXER, METHOD OF MANUFACTURING TERAHERTZ MIXER, AND ELECT...
- Publication number 20220109241
- Publication date Apr 7, 2022
- Nuctech Company Limited
- Yuanjing LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PORTABLE TERAHERTZ SECURITY INSPECTION APPARATUS
- Publication number 20220066065
- Publication date Mar 3, 2022
- Nuctech Company Limited
- Ziran Zhao
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ SECURITY INSPECTION ROBOT
- Publication number 20210394366
- Publication date Dec 23, 2021
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
SECURITY INSPECTION APPARATUS AND METHOD OF CONTROLLING THE SAME
- Publication number 20210325561
- Publication date Oct 21, 2021
- TSINGHUA UNIVERSITY
- Ziran Zhao
- G01 - MEASURING TESTING
Information Patent Application
SECURITY INSPECTION APPARATUS AND METHOD OF CONTROLLING THE SAME
- Publication number 20210325528
- Publication date Oct 21, 2021
- TSINGHUA UNIVERSITY
- Zhiqiang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TERAHERTZ DETECTOR
- Publication number 20190234870
- Publication date Aug 1, 2019
- Nuctech Company Limited
- Ziran ZHAO
- G01 - MEASURING TESTING
Information Patent Application
AERIAL CDZNTE INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20180284302
- Publication date Oct 4, 2018
- Nuctech Company Limited
- Lan ZHANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR PROCESSING SIGNALS OF SEMICONDUCTOR DETECTOR
- Publication number 20160018537
- Publication date Jan 21, 2016
- TSINGHUA UNIVERSITY
- Lan ZHANG
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Security inspection apparatus and method of controlling the same

Terahertz mixer, method of manufacturing terahertz mixer, and elect...

Security inspection apparatus and method of controlling the same

Terahertz detector and method of manufacturing terahertz detector

Portable terahertz security inspection apparatus

Terahertz security inspection robot

Terahertz detector

Method and apparatus for processing signals of semiconductor detector

Patents Applicationslast 30 patents

METHOD OF MANUFACTURING TERAHERTZ DETECTION DEVICE, AND DETECTION A...

ELECTROMAGNETIC IMAGING DEVICE FOR ACTIVE MICROWAVE AND MILLIMETER...

TERAHERTZ DETECTOR AND METHOD OF MANUFACTURING TERAHERTZ DETECTOR

TERAHERTZ MIXER, METHOD OF MANUFACTURING TERAHERTZ MIXER, AND ELECT...

PORTABLE TERAHERTZ SECURITY INSPECTION APPARATUS

TERAHERTZ SECURITY INSPECTION ROBOT

SECURITY INSPECTION APPARATUS AND METHOD OF CONTROLLING THE SAME

SECURITY INSPECTION APPARATUS AND METHOD OF CONTROLLING THE SAME

TERAHERTZ DETECTOR

AERIAL CDZNTE INSPECTION SYSTEM AND INSPECTION METHOD

METHOD AND APPARATUS FOR PROCESSING SIGNALS OF SEMICONDUCTOR DETECTOR