Membership
Tour
Register
Log in
Xun Chen
Follow
Person
Sunnyvale, CA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
System and method for lithography simulation
Patent number
8,893,067
Issue date
Nov 18, 2014
ASML Netherlands B.V.
Jun Ye
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for lithography simulation
Patent number
8,516,405
Issue date
Aug 20, 2013
ASML Netherlands B.V.
Jun Ye
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Process window signature patterns for lithography process control
Patent number
8,318,391
Issue date
Nov 27, 2012
ASML Netherlands B.V.
Jun Ye
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
System and method for lithography simulation
Patent number
8,209,640
Issue date
Jun 26, 2012
ASML Netherlands B.V.
Jun Ye
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Process window signature patterns for lithography process control
Patent number
8,057,967
Issue date
Nov 15, 2011
ASML Netherlands B.V.
Jun Ye
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
System and method for lithography simulation
Patent number
7,873,937
Issue date
Jan 18, 2011
ASML Netherlands B.V.
Jun Ye
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for identifying and using process window signature patterns...
Patent number
7,695,876
Issue date
Apr 13, 2010
Brion Technologies, Inc.
Jun Ye
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and apparatus for monitoring integrated circuit fabrication
Patent number
7,233,874
Issue date
Jun 19, 2007
Brion Technologies, Inc.
Jun Ye
G01 - MEASURING TESTING
Information
Patent Grant
System and method for lithography simulation
Patent number
7,120,895
Issue date
Oct 10, 2006
Brion Technologies, Inc.
Jun Ye
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for lithography simulation
Patent number
7,117,478
Issue date
Oct 3, 2006
Brion Technologies, Inc.
Jun Ye
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for lithography simulation
Patent number
7,117,477
Issue date
Oct 3, 2006
Brion Tecnologies, Inc.
Jun Ye
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for lithography simulation
Patent number
7,114,145
Issue date
Sep 26, 2006
Brion Technologies, Inc.
Jun Ye
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for lithography simulation
Patent number
7,111,277
Issue date
Sep 19, 2006
Brion Technologies, Inc.
Jun Ye
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for lithography process monitoring and control
Patent number
7,053,355
Issue date
May 30, 2006
Brion Technologies, Inc.
Jun Ye
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for lithography simulation
Patent number
7,003,758
Issue date
Feb 21, 2006
Brion Technologies, Inc.
Jun Ye
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for lithography process monitoring and control
Patent number
6,969,864
Issue date
Nov 29, 2005
Brion Technologies, Inc.
Jun Ye
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
System and method for lithography process monitoring and control
Patent number
6,969,837
Issue date
Nov 29, 2005
Brion Technologies, Inc.
Jun Ye
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and apparatus for monitoring integrated circuit fabrication
Patent number
6,959,255
Issue date
Oct 25, 2005
Brion Technologies, Inc.
Jun Ye
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring integrated circuit fabrication
Patent number
6,892,156
Issue date
May 10, 2005
Brion Technologies, Inc.
Jun Ye
G01 - MEASURING TESTING
Information
Patent Grant
System and method for lithography process monitoring and control
Patent number
6,884,984
Issue date
Apr 26, 2005
Brion Technologies, Inc.
Jun Ye
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and apparatus for monitoring integrated circuit fabrication
Patent number
6,879,924
Issue date
Apr 12, 2005
Brion Technologies, Inc.
Jun Ye
G01 - MEASURING TESTING
Information
Patent Grant
System and method for lithography process monitoring and control
Patent number
6,828,542
Issue date
Dec 7, 2004
Brion Technologies, Inc.
Jun Ye
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and apparatus for monitoring integrated circuit fabrication
Patent number
6,820,028
Issue date
Nov 16, 2004
Brion Technologies, Inc.
Jun Ye
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring integrated circuit fabrication
Patent number
6,807,503
Issue date
Oct 19, 2004
Brion Technologies, Inc.
Jun Ye
G01 - MEASURING TESTING
Information
Patent Grant
System and method for lithography process monitoring and control
Patent number
6,806,456
Issue date
Oct 19, 2004
Brion Technologies, Inc.
Jun Ye
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
System and method for lithography process monitoring and control
Patent number
6,803,554
Issue date
Oct 12, 2004
Brion Technologies, Inc.
Jun Ye
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Systems, methods and computer program products for detecting the po...
Patent number
6,064,486
Issue date
May 16, 2000
Leland Stanford Junior University
Xun Chen
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
System and Method for Lithography Simulation
Publication number
20120269421
Publication date
Oct 25, 2012
ASML NETHERLANDS B.V.
Jun Ye
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Process Window Signature Patterns for Lithography Process Control
Publication number
20120021343
Publication date
Jan 26, 2012
ASML NETHERLANDS B.V.
Jun Ye
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
System and Method for Lithography Simulation
Publication number
20110083113
Publication date
Apr 7, 2011
ASML NETHERLANDS B.V.
Jun Ye
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method for identifying and using process window signature patterns...
Publication number
20100151364
Publication date
Jun 17, 2010
Brion Technology, Inc.
Jun Ye
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD FOR IDENTIFYING AND USING PROCESS WINDOW SIGNATURE PATTERNS...
Publication number
20070050749
Publication date
Mar 1, 2007
BRION TECHNOLOGIES, INC.
Jun Ye
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
System and method for lithography simulation
Publication number
20070022402
Publication date
Jan 25, 2007
Jun Ye
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System and method for lithography process monitoring and control
Publication number
20060000964
Publication date
Jan 5, 2006
Jun Ye
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
System and method for lithography simulation
Publication number
20050166174
Publication date
Jul 28, 2005
Jun Ye
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System and method for lithography simulation
Publication number
20050122500
Publication date
Jun 9, 2005
Jun Ye
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus for monitoring integrated circuit fabrication
Publication number
20050125184
Publication date
Jun 9, 2005
Jun Ye
G01 - MEASURING TESTING
Information
Patent Application
System and method for lithography simulation
Publication number
20050120327
Publication date
Jun 2, 2005
Jun Ye
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System and method for lithography simulation
Publication number
20050097500
Publication date
May 5, 2005
Jun Ye
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System and method for lithography simulation
Publication number
20050091633
Publication date
Apr 28, 2005
Jun Ye
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System and method for lithography simulation
Publication number
20050076322
Publication date
Apr 7, 2005
Jun Ye
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System and method for lithography process monitoring and control
Publication number
20040232313
Publication date
Nov 25, 2004
Jun Ye
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method and apparatus for monitoring integrated circuit fabrication
Publication number
20040230396
Publication date
Nov 18, 2004
Jun Ye
G01 - MEASURING TESTING
Information
Patent Application
System and method for lithography process monitoring and control
Publication number
20040222354
Publication date
Nov 11, 2004
Jun Ye
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method and apparatus for monitoring integrated circuit fabrication
Publication number
20040162692
Publication date
Aug 19, 2004
Jun Ye
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for monitoring integrated circuit fabrication
Publication number
20040153279
Publication date
Aug 5, 2004
Jun Ye
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for monitoring integrated circuit fabrication
Publication number
20040148120
Publication date
Jul 29, 2004
Jun Ye
G01 - MEASURING TESTING
Information
Patent Application
System and method for lithography process monitoring and control
Publication number
20040140418
Publication date
Jul 22, 2004
Jun Ye
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
System and method for lithography process monitoring and control
Publication number
20040119036
Publication date
Jun 24, 2004
Jun Ye
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method and apparatus for monitoring integrated circuit fabrication
Publication number
20040098216
Publication date
May 20, 2004
Jun Ye
G01 - MEASURING TESTING
Information
Patent Application
System and method for lithography process monitoring and control
Publication number
20030226951
Publication date
Dec 11, 2003
Jun Ye
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY