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Rolla, MO, US
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last 30 patents
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Patent Grant
Method and system for far-field microscopy to exceeding diffraction...
Patent number
7,298,476
Issue date
Nov 20, 2007
Laser Microtech, L.L.C.
Hai-Lung Tsai
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Method and system for far-field microscopy to exceeding diffraction...
Publication number
20070096038
Publication date
May 3, 2007
Laser Microtech, L.L.C.
Hai-Lung Tsai
G01 - MEASURING TESTING