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Ya-Chung Yu
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Chiayi City, TW
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Patents Grants
last 30 patents
Information
Patent Grant
Antenna structure and multi-beam antenna array using the same
Patent number
8,847,836
Issue date
Sep 30, 2014
Industrial Technology Research Institute
Ya Chung Yu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Calibration devices and calibration methods
Patent number
8,810,447
Issue date
Aug 19, 2014
Industrial Technology Research Institute
Chun-Yen Huang
G01 - MEASURING TESTING
Information
Patent Grant
Image systems and scan methods
Patent number
8,736,919
Issue date
May 27, 2014
Industrial Technology Research Institute
Li-Yuan Chang
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Zero bias power detector
Patent number
8,598,866
Issue date
Dec 3, 2013
Industrial Technology Research Institute
Chun-Yen Huang
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnetic conductor reflecting plate and antenna array thereo...
Patent number
8,102,296
Issue date
Jan 24, 2012
Industrial Technology Research Institute
Jenn-Hwan Tarng
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CALIBRATION DEVICES AND CALIBRATION METHODS
Publication number
20130135139
Publication date
May 30, 2013
Chun-Yen HUANG
G01 - MEASURING TESTING
Information
Patent Application
IMAGE SYSTEMS AND SCAN METHODS
Publication number
20130120805
Publication date
May 16, 2013
Industrial Technology Research Institute
Li-Yuan Chang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ANTENNA STRUCTURE AND MULTI-BEAM ANTENNA ARRAY USING THE SAME
Publication number
20120139805
Publication date
Jun 7, 2012
Industrial Technology Research Institute
Ya Chung YU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Zero Bias Power Detector
Publication number
20120062212
Publication date
Mar 15, 2012
Industrial Technology Research Institute
Chun-Yen Huang
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNETIC CONDUCTOR REFLECTING PLATE AND ANTENNA ARRAY THEREO...
Publication number
20110122018
Publication date
May 26, 2011
Industrial Technology Research Institute
Jenn-Hwan Tarng
G01 - MEASURING TESTING