YA-HUNG LO

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ZHUBEI, TW

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Patents Grantslast 30 patents

Information Patent Grant
Probing apparatus
- Patent number 11,536,765
- Issue date Dec 27, 2022
- MPI CORPORATION
- Kang-Yen Fu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adjustable probe device for impedance testing for circuit board
- Patent number 11,460,498
- Issue date Oct 4, 2022
- MPI Corporation
- Yang-Hung Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Electrical testing device
- Patent number 9,523,708
- Issue date Dec 20, 2016
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR ADJUSTING THE POSITION OF PROBING BASE AND PROBING MACHI...
- Publication number 20240393386
- Publication date Nov 28, 2024
- MPI CORPORATION
- YA-HUNG LO
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT BOARD DETECTION DEVICE
- Publication number 20240248129
- Publication date Jul 25, 2024
- MPI Corporation
- Wen-Wei Lin
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTABLE PROBE DEVICE FOR IMPEDANCE TESTING FOR CIRCUIT BOARD
- Publication number 20210102992
- Publication date Apr 8, 2021
- MPI Corporation
- YANG-HUNG CHENG
- G01 - MEASURING TESTING
Information Patent Application
PROBING APPARATUS
- Publication number 20200400740
- Publication date Dec 24, 2020
- MPI Corporation
- Kang-Yen Fu
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL TESTING DEVICE
- Publication number 20150204907
- Publication date Jul 23, 2015
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING