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Yacouba Diawara
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Madison, WI, US
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Patents Grants
last 30 patents
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Patent Grant
X-ray detection system for wavelength dispersive and energy dispers...
Patent number
7,928,400
Issue date
Apr 19, 2011
Bruker AXS, Inc.
Yacouba Diawara
G01 - MEASURING TESTING
Information
Patent Grant
Parallax free and spark protected X-ray detector
Patent number
7,639,783
Issue date
Dec 29, 2009
Bruker AXS, Inc.
Yacouba Diawara
G01 - MEASURING TESTING
Information
Patent Grant
Electron multiplier and method of making same
Patent number
6,455,987
Issue date
Sep 24, 2002
Bruker Analytical X-Ray Systems, Inc.
Roger Durst
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Readout structure and technique for electron cloud avalanche detectors
Patent number
6,340,819
Issue date
Jan 22, 2002
Bruker AXS, Inc.
Roger D. Durst
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
X-ray detector with photodetector embedded in scintillator
Publication number
20070272872
Publication date
Nov 29, 2007
Bruker AXS, Inc.
Vladimir A. Joshkin
G01 - MEASURING TESTING