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Yacov Malinovich
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Kiriat Tivon, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Imaging device and method for high-sensitivity optical scanning and...
Patent number
9,232,114
Issue date
Jan 5, 2016
Orbotech Ltd.
Yigal Katzir
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and system for measuring bumps based on phase and amplitude...
Patent number
9,147,102
Issue date
Sep 29, 2015
Camtek Ltd.
Shimon Koren
G01 - MEASURING TESTING
Information
Patent Grant
System and a method for insepcting an object using a hybrid sensor
Patent number
8,565,508
Issue date
Oct 22, 2013
Camtek Ltd.
Yosi Cherbis
G01 - MEASURING TESTING
Information
Patent Grant
Imaging device and method for high-sensitivity optical scanning and...
Patent number
8,536,506
Issue date
Sep 17, 2013
Orbotech Ltd.
Yigal Katzir
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Imaging device and method for high-sensitivity optical scanning and...
Patent number
8,119,969
Issue date
Feb 21, 2012
Orbotech Ltd.
Yigal Katzir
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Imaging device and method for high-sensitivity optical scanning and...
Patent number
7,897,902
Issue date
Mar 1, 2011
Orbotech Ltd.
Yigal Katzir
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
System and method for the fabrication of an electro-optical module
Patent number
7,668,414
Issue date
Feb 23, 2010
Colorchip (Israel) Ltd
Amotz Shemi
G02 - OPTICS
Information
Patent Grant
High-sensitivity optical scanning using memory integration
Patent number
7,417,243
Issue date
Aug 26, 2008
Orbotech Ltd.
Yigal Katzir
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
High-sensitivity optical scanning using memory integration
Patent number
7,129,509
Issue date
Oct 31, 2006
Orbotech, Ltd.
Yigal Katzir
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
High-sensitivity optical scanning using memory integration
Patent number
7,009,163
Issue date
Mar 7, 2006
Orbotech Ltd.
Yigal Katzir
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method for making backside illuminated image sensor
Patent number
6,168,965
Issue date
Jan 2, 2001
Tower Semiconductor Ltd.
Yacov Malinovich
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Backside illuminated image sensor
Patent number
6,169,319
Issue date
Jan 2, 2001
Tower Semiconductor Ltd.
Yacov Malinovich
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
IMAGING DEVICE AND METHOD FOR HIGH-SENSITIVITY OPTICAL SCANNING AND...
Publication number
20160094760
Publication date
Mar 31, 2016
ORBOTECH LTD.
Yigal KATZIR
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
IMAGING DEVICE AND METHOD FOR HIGH-SENSITIVITY OPTICAL SCANNING AND...
Publication number
20130329103
Publication date
Dec 12, 2013
ORBOTECH LTD.
Yigal Katzir
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR MEASURING BUMPS BASED ON PHASE AND AMPLITUDE...
Publication number
20130170712
Publication date
Jul 4, 2013
CAMTEK LTD
Shimon Koren
G02 - OPTICS
Information
Patent Application
IMAGING DEVICE AND METHOD FOR HIGH-SENSITIVITY OPTICAL SCANNING AND...
Publication number
20120206634
Publication date
Aug 16, 2012
Orbotech Ltd.
Yigal Katzir
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
METHOD AND SYSTEM FOR EDGE INSPECTION USING A TILTED ILLUMINATION
Publication number
20110317003
Publication date
Dec 29, 2011
Roy PORAT
G01 - MEASURING TESTING
Information
Patent Application
IMAGING DEVICE AND METHOD FOR HIGH-SENSITIVITY OPTICAL SCANNING AND...
Publication number
20110114823
Publication date
May 19, 2011
Orbotech Ltd.
Yigal Katzir
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SYSTEM AND A METHOD FOR BROADBAND INTERFEROMETRY
Publication number
20110032534
Publication date
Feb 10, 2011
CAMTEK LTD
Yacov Malinovich
G01 - MEASURING TESTING
Information
Patent Application
System and method for the fabrication of an electro-optical module
Publication number
20090016670
Publication date
Jan 15, 2009
Amotz Shemi
G02 - OPTICS
Information
Patent Application
HIGH-SENSITIVITY OPTICAL SCANNING USING MEMORY INTEGRATION
Publication number
20080278775
Publication date
Nov 13, 2008
Orbotech Ltd.
Yigal Katzir
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Methods and Process of Tapering Waveguides and of Forming Optimized...
Publication number
20080264107
Publication date
Oct 30, 2008
Yacov Malinovich
G02 - OPTICS
Information
Patent Application
HIGH-SENSITIVITY OPTICAL SCANNING USING MEMORY INTEGRATION
Publication number
20070012865
Publication date
Jan 18, 2007
ORBOTECH LTD.
Yigal Katzir
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
High-sensitivity optical scanning using memory integration
Publication number
20060006311
Publication date
Jan 12, 2006
ORBOTECH LTD.
Yigal Katzir
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Method of and system for multiplexed analysis by spectral imaging
Publication number
20030215791
Publication date
Nov 20, 2003
Applied Spectral Imaging Ltd.
Yuval Garini
G01 - MEASURING TESTING
Information
Patent Application
High-sensitivity optical scanning using memory integration
Publication number
20030006364
Publication date
Jan 9, 2003
ORBOTECH LTD.
Yigal Katzir
G01 - MEASURING TESTING