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Yael Duek-Golan
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Jerusalem, IL
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last 30 patents
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Patent Grant
Systems for total coverage analysis and ranking of circuit designs
Patent number
8,214,782
Issue date
Jul 3, 2012
Cadence Design Systems, Inc.
Swapnajit Chakraborti
G01 - MEASURING TESTING
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Patent Grant
Systems, methods, and apparatus for total coverage analysis and ran...
Patent number
7,886,242
Issue date
Feb 8, 2011
Cadence Design Systems, Inc.
Swapnajit Chakraborti
G01 - MEASURING TESTING