Yafeng Zhang

Follow

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Pattern measuring apparatus
- Patent number 9,024,272
- Issue date May 5, 2015
- Hitachi High-Technologies Corporation
- Kei Sakai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Pattern Measuring Apparatus and Computer Program
- Publication number 20120267528
- Publication date Oct 25, 2012
- Hitachi High-Technologies Corporation
- Kei Sakai
- G06 - COMPUTING CALCULATING COUNTING