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Yair Alon
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Thousand Oaks, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Technique for determining closest point of approach
Patent number
8,831,906
Issue date
Sep 9, 2014
Exelis Inc.
Yair Alon
G01 - MEASURING TESTING
Information
Patent Grant
Radar registration using targets of opportunity
Patent number
8,362,943
Issue date
Jan 29, 2013
Northrop Grumman Guidance and Electronics Company, Inc.
Mark H. Jacobs
G01 - MEASURING TESTING
Information
Patent Grant
Mode 5 detection process using phase and amplitude correlation
Patent number
8,102,302
Issue date
Jan 24, 2012
Northrop Grumman Guidance and Electronics Company, Inc.
Yair Alon
G01 - MEASURING TESTING
Information
Patent Grant
Technique for mitigating multipath impacts on azimuth accuracy in a...
Patent number
7,675,456
Issue date
Mar 9, 2010
Northrop Grumman Corporation
Mostafa A. Karam
G01 - MEASURING TESTING
Information
Patent Grant
Using radar targets of opportunity to build a monopulse calibration...
Patent number
7,548,189
Issue date
Jun 16, 2009
Northrop Grumman Corporation
Yair Alon
G01 - MEASURING TESTING
Information
Patent Grant
Radar based application programmable waveform generator component
Patent number
7,050,000
Issue date
May 23, 2006
Northrop Grumman Corporation
Garth Ernest Weals
G01 - MEASURING TESTING
Information
Patent Grant
False reflected target elimination and automatic reflector mapping...
Patent number
6,473,027
Issue date
Oct 29, 2002
Northrop Grumman Corporation
Yair Alon
G01 - MEASURING TESTING
Information
Patent Grant
Registration method for multiple sensor radar
Patent number
6,225,942
Issue date
May 1, 2001
Litton Systems, Inc.
Yair Alon
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Radar registration using targets of opportunity
Publication number
20120001793
Publication date
Jan 5, 2012
Mark H. Jacobs
G01 - MEASURING TESTING
Information
Patent Application
MODE 5 DETECTION PROCESS USING PHASE AND AMPLITUDE CORRELATION
Publication number
20110285572
Publication date
Nov 24, 2011
Northrop Grumman Guidance and Electronics Company, Inc.
Yair Alon
G01 - MEASURING TESTING
Information
Patent Application
TECHNIQUE FOR MITIGATING MULTIPATH IMPACTS ON AZIMUTH ACCURACY IN A...
Publication number
20090096674
Publication date
Apr 16, 2009
Mostafa A. Karam
G01 - MEASURING TESTING
Information
Patent Application
Using radar targets of opportunity to build a monopulse calibration...
Publication number
20080042896
Publication date
Feb 21, 2008
Yair Alon
G01 - MEASURING TESTING
Information
Patent Application
Radar based application programmable waveform generator component
Publication number
20050040984
Publication date
Feb 24, 2005
Garth Ernest Weals
G01 - MEASURING TESTING
Information
Patent Application
FALSE REFLECTED TARGET ELIMINATION AND AUTOMATIC REFLECTOR MAPPING...
Publication number
20020180631
Publication date
Dec 5, 2002
Yair Alon
G01 - MEASURING TESTING