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Yair Faiershtein
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Nazareth Illit, IL
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last 30 patents
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Patent Grant
Integrated circuit sample preparation for alpha emission measurements
Patent number
8,471,215
Issue date
Jun 25, 2013
Marvell Israel (M.I.S.L) Ltd.
Eli Kurin
G01 - MEASURING TESTING
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Patent Grant
Integrated circuit sample preparation for alpha emission measurements
Patent number
8,330,117
Issue date
Dec 11, 2012
Marvell Israel (M.I.S.L) Ltd.
Eli Kurin
G01 - MEASURING TESTING