Yakabe Masami

Person

Amagasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Displacement measurement apparatus for microstructure and displceme...
- Patent number 8,141,426
- Issue date Mar 27, 2012
- Tokyo Electron Limited
- Naoki Ikeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Pressure wave generator and temperature controlling method thereof
- Patent number 8,130,593
- Issue date Mar 6, 2012
- Tokyo Electron Limited
- Masato Hayashi
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Switch array
- Patent number 7,994,443
- Issue date Aug 9, 2011
- Tokyo Electron Limited
- Masato Hayashi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for manufacturing an interposer
- Patent number 7,891,090
- Issue date Feb 22, 2011
- Tokyo Electron Limited
- Masami Yakabe
- G01 - MEASURING TESTING
Information Patent Grant
Through substrate, interposer and manufacturing method of through s...
- Patent number 7,866,038
- Issue date Jan 11, 2011
- Tokyo Electron Limited
- Masami Yakabe
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Device, method and program for inspecting microstructure
- Patent number 7,726,190
- Issue date Jun 1, 2010
- Tokyo Electron Limited
- Toshiyuki Matsumoto
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Device for inspecting micro structure, method for inspecting micro...
- Patent number 7,383,732
- Issue date Jun 10, 2008
- Octec Inc.
- Katsuya Okumura
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Potential fixing device and potential fixing method
- Patent number 7,368,920
- Issue date May 6, 2008
- Tokyo Electron Limited
- Masami Yakabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Probing card and inspection apparatus for microstructure
- Patent number 7,348,788
- Issue date Mar 25, 2008
- Tokyo Electron Limited
- Masami Yakabe
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Capacitance measurement method of micro structures of integrated ci...
- Patent number 7,176,706
- Issue date Feb 13, 2007
- Tokyo Electron Limited
- Matsumoto Toshiyuki
- G01 - MEASURING TESTING
Information Patent Grant
Sensor capacity sensing apparatus and sensor capacity sensing method
- Patent number 7,088,112
- Issue date Aug 8, 2006
- Tokyo Electron Limited
- Masami Yakabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Potential fixing device, potential fixing method, and capacitance m...
- Patent number 7,046,016
- Issue date May 16, 2006
- Tokyo Electron Limited
- Masami Yakabe
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic capacitance detection circuit and microphone device
- Patent number 7,034,551
- Issue date Apr 25, 2006
- Tokyo Electron Limited
- Masami Yakabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Impedance measuring circuit and capacitance measuring circuit
- Patent number 7,023,223
- Issue date Apr 4, 2006
- Tokyo Electron Limited
- Masami Yakabe
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic capacitance detection circuit and microphone device
- Patent number 7,019,540
- Issue date Mar 28, 2006
- Tokyo Electron Limited
- Masami Yakabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Circuit and method for impedance detection
- Patent number 7,005,865
- Issue date Feb 28, 2006
- Tokyo Electron Limited
- Masami Yakabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Capacitance measurement method of micro structures of integrated ci...
- Patent number 6,906,548
- Issue date Jun 14, 2005
- Tokyo Electron Limited
- Matsumoto Toshiyuki
- G01 - MEASURING TESTING
Information Patent Grant
Impedance detection circuit, impedance detection device, and impeda...
- Patent number 6,756,790
- Issue date Jun 29, 2004
- Tokyo Electron Limited
- Masami Yakabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTERPOSER AND MANUFACTURING METHOD FOR THE SAME
- Publication number 20120085655
- Publication date Apr 12, 2012
- Tokyo Elecron Limited
- Kenichi Kagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERPOSER, PROBE CARD AND METHOD FOR MANUFACTURING THE INTERPOSER
- Publication number 20110109338
- Publication date May 12, 2011
- TOKYO ELECTRON LIMITED
- Masami Yakabe
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE WAVE GENERATOR AND TEMPERATURE CONTROLLING METHOD THEREOF
- Publication number 20100025145
- Publication date Feb 4, 2010
- TOKYO ELECTRON LIMITED
- Masato Hayashi
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Application
Displacement Measurement apparatus for microstructure and displceme...
- Publication number 20090145230
- Publication date Jun 11, 2009
- TOKYO ELECTRON LIMITED
- Naoki Ikeuchi
- G01 - MEASURING TESTING
Information Patent Application
Microstructure Probe Card, and Microstructure Inspecting Device, Me...
- Publication number 20090128171
- Publication date May 21, 2009
- Katsuya Okumura
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Switch Array
- Publication number 20090045039
- Publication date Feb 19, 2009
- Masato Hayashi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MICROSTRUCTURE INSPECTING APPARATUS AND MICROSTRUCTURE INSPECTING M...
- Publication number 20090039908
- Publication date Feb 12, 2009
- TOKYO ELECTRON LIMITED
- Naoki Ikeuchi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Microstructure Inspecting Apparatus and Microstructure Inspecting M...
- Publication number 20080302185
- Publication date Dec 11, 2008
- Masami Yakabe
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Minute structure inspection device, inspection method, and inspecti...
- Publication number 20080223136
- Publication date Sep 18, 2008
- TOKYO ELECTRON LIMITED
- Masami Yakabe
- G01 - MEASURING TESTING
Information Patent Application
Device, Method and Program for Inspecting Microstructure
- Publication number 20080190206
- Publication date Aug 14, 2008
- TOKYO ELECTRON LIMITED
- Toshiyuki Matsumoto
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Interposer, Probe Card and Method for Manufacturing the Interposer
- Publication number 20080171452
- Publication date Jul 17, 2008
- Masami Yakabe
- G01 - MEASURING TESTING
Information Patent Application
Interposer And Manufacturing Method For The Same
- Publication number 20080067073
- Publication date Mar 20, 2008
- Kenichi Kagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device
- Publication number 20070278650
- Publication date Dec 6, 2007
- Kenichi Kagawa
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Probe
- Publication number 20070257692
- Publication date Nov 8, 2007
- Masami Yakabe
- G01 - MEASURING TESTING
Information Patent Application
Through Substrate, Interposer and Manufacturing Method of Through S...
- Publication number 20070246253
- Publication date Oct 25, 2007
- Masami Yakabe
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Probing card and inspection apparatus for microstructure
- Publication number 20070069746
- Publication date Mar 29, 2007
- Masami Yakabe
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Device for inspecting micro structure, method for inspecting micro...
- Publication number 20050279170
- Publication date Dec 22, 2005
- Katsuya Okumura
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Capacitance measurement method of micro structures of integrated ci...
- Publication number 20050225350
- Publication date Oct 13, 2005
- Matsumoto Toshiyuki
- G01 - MEASURING TESTING
Information Patent Application
Potential fixing device, potential fixing method, and capacitance m...
- Publication number 20050116700
- Publication date Jun 2, 2005
- Masami Yakabe
- G01 - MEASURING TESTING
Information Patent Application
Capacitance measuring circuit, capacitance measuring instrument, an...
- Publication number 20050040833
- Publication date Feb 24, 2005
- Masami Yakabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Impedance measuring circuit, it's method, and capacitance measuring...
- Publication number 20050035771
- Publication date Feb 17, 2005
- Masami Yakabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Sensor capacity sensing apparatus and sensor capacity sensing method
- Publication number 20050036271
- Publication date Feb 17, 2005
- Masami Yakabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Potential fixing device and potential fixing method
- Publication number 20050030679
- Publication date Feb 10, 2005
- Masami Yakabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Impedance measuring circuit and capacitance measuring circuit
- Publication number 20050030046
- Publication date Feb 10, 2005
- Masami Yakabe
- G01 - MEASURING TESTING
Information Patent Application
Capacitance measuring circuit capacitance measuring instrument and...
- Publication number 20050017737
- Publication date Jan 27, 2005
- Masami Yakabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Impedance detection circuit, impedance detector and method of imped...
- Publication number 20020171454
- Publication date Nov 21, 2002
- Masami Yakabe
- G01 - MEASURING TESTING

Yakabe Masami

Person

Patents Grantslast 30 patents

Displacement measurement apparatus for microstructure and displceme...

Pressure wave generator and temperature controlling method thereof

Switch array

Method for manufacturing an interposer

Through substrate, interposer and manufacturing method of through s...

Device, method and program for inspecting microstructure

Device for inspecting micro structure, method for inspecting micro...

Potential fixing device and potential fixing method

Probing card and inspection apparatus for microstructure

Capacitance measurement method of micro structures of integrated ci...

Sensor capacity sensing apparatus and sensor capacity sensing method

Potential fixing device, potential fixing method, and capacitance m...

Electrostatic capacitance detection circuit and microphone device

Impedance measuring circuit and capacitance measuring circuit

Electrostatic capacitance detection circuit and microphone device

Circuit and method for impedance detection

Capacitance measurement method of micro structures of integrated ci...

Impedance detection circuit, impedance detection device, and impeda...

Patents Applicationslast 30 patents

INTERPOSER AND MANUFACTURING METHOD FOR THE SAME

INTERPOSER, PROBE CARD AND METHOD FOR MANUFACTURING THE INTERPOSER

PRESSURE WAVE GENERATOR AND TEMPERATURE CONTROLLING METHOD THEREOF

Displacement Measurement apparatus for microstructure and displceme...

Microstructure Probe Card, and Microstructure Inspecting Device, Me...

Switch Array

MICROSTRUCTURE INSPECTING APPARATUS AND MICROSTRUCTURE INSPECTING M...

Microstructure Inspecting Apparatus and Microstructure Inspecting M...

Minute structure inspection device, inspection method, and inspecti...

Device, Method and Program for Inspecting Microstructure

Interposer, Probe Card and Method for Manufacturing the Interposer

Interposer And Manufacturing Method For The Same

Semiconductor Device

Probe

Through Substrate, Interposer and Manufacturing Method of Through S...

Probing card and inspection apparatus for microstructure

Device for inspecting micro structure, method for inspecting micro...

Capacitance measurement method of micro structures of integrated ci...

Potential fixing device, potential fixing method, and capacitance m...

Capacitance measuring circuit, capacitance measuring instrument, an...

Impedance measuring circuit, it's method, and capacitance measuring...

Sensor capacity sensing apparatus and sensor capacity sensing method

Potential fixing device and potential fixing method

Impedance measuring circuit and capacitance measuring circuit

Capacitance measuring circuit capacitance measuring instrument and...

Impedance detection circuit, impedance detector and method of imped...