Yakov Weinberg

Person

Modi'in, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Technique for measuring overlay between layers of a multilayer stru...
- Patent number 10,354,376
- Issue date Jul 16, 2019
- Applied Materials Israel Ltd.
- Yakov Weinberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Technique for measuring overlay between layers of a multilayer stru...
- Patent number 9,916,652
- Issue date Mar 13, 2018
- Applied Materials Israel Ltd.
- Yakov Weinberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
CD-SEM technique for wafers fabrication control
- Patent number 9,824,852
- Issue date Nov 21, 2017
- Applied Materials Israel Ltd.
- Roman Kris
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Technique for visualizing elements in images by color coding
- Patent number 9,674,536
- Issue date Jun 6, 2017
- Applied Materials Israel, Ltd.
- Yakov Weinberg
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Technique for measuring overlay between layers of a multilayer stru...
- Patent number 9,530,199
- Issue date Dec 27, 2016
- Applied Materials Israel Ltd.
- Yakov Weinberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional mapping using scanning electron microscope images
- Patent number 9,378,923
- Issue date Jun 28, 2016
- Applied Materials Israel, Ltd.
- Ishai Schwarzband
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional mapping using scanning electron microscope images
- Patent number 8,946,627
- Issue date Feb 3, 2015
- Applied Materials Israel, Ltd.
- Ishai Schwarzband
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional mapping using scanning electron microscope images
- Patent number 8,604,427
- Issue date Dec 10, 2013
- Applied Materials Israel, Ltd.
- Ishai Schwarzband
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
EYE TRACKING DEVICE AND A METHOD THEREOF
- Publication number 20220100268
- Publication date Mar 31, 2022
- EYEWAY VISION LTD.
- Yakov WEINBERG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...
- Publication number 20180268539
- Publication date Sep 20, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Yakov WEINBERG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...
- Publication number 20170243343
- Publication date Aug 24, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Yakov WEINBERG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CD-SEM TECHNIQUE FOR WAFERS FABRICATION CONTROL
- Publication number 20170194125
- Publication date Jul 6, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Roman KRIS
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUE FOR VISUALIZING ELEMENTS IN IMAGES BY COLOR CODING
- Publication number 20170134735
- Publication date May 11, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Yakov WEINBERG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...
- Publication number 20170018066
- Publication date Jan 19, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Yakov WEINBERG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL MAPPING USING SCANNING ELECTRON MICROSCOPE IMAGES
- Publication number 20150136960
- Publication date May 21, 2015
- APPLIED MATERIALS ISRAEL, LTD.
- Ishai Schwarzband
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THREE-DIMENSIONAL MAPPING USING SCANNING ELECTRON MICROSCOPE IMAGES
- Publication number 20140074419
- Publication date Mar 13, 2014
- APPLIED MATERIALS ISRAEL, LTD.
- Ishai Schwarzband
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL MAPPING USING SCANNING ELECTRON MICROSCOPE IMAGES
- Publication number 20130200255
- Publication date Aug 8, 2013
- APPLIED MATERIALS ISRAEL, LTD.
- Ishai Schwarzband
- G01 - MEASURING TESTING

Yakov Weinberg

Person

Patents Grantslast 30 patents

Technique for measuring overlay between layers of a multilayer stru...

Technique for measuring overlay between layers of a multilayer stru...

CD-SEM technique for wafers fabrication control

Technique for visualizing elements in images by color coding

Technique for measuring overlay between layers of a multilayer stru...

Three-dimensional mapping using scanning electron microscope images

Three-dimensional mapping using scanning electron microscope images

Three-dimensional mapping using scanning electron microscope images

Patents Applicationslast 30 patents

EYE TRACKING DEVICE AND A METHOD THEREOF

TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...

TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...

CD-SEM TECHNIQUE FOR WAFERS FABRICATION CONTROL

TECHNIQUE FOR VISUALIZING ELEMENTS IN IMAGES BY COLOR CODING

TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...

THREE-DIMENSIONAL MAPPING USING SCANNING ELECTRON MICROSCOPE IMAGES

THREE-DIMENSIONAL MAPPING USING SCANNING ELECTRON MICROSCOPE IMAGES

THREE-DIMENSIONAL MAPPING USING SCANNING ELECTRON MICROSCOPE IMAGES