Yalaj Goyal

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Indore, IN

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit test socket with integrated device picking mecha...
- Patent number 12,352,780
- Issue date Jul 8, 2025
- SanDisk Technologies, Inc.
- Yalaj Goyal
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT TEST SOCKET WITH INTEGRATED DEVICE PICKING MECHA...
- Publication number 20230417796
- Publication date Dec 28, 2023
- Western Digital Technologies, Inc.
- Yalaj Goyal
- G01 - MEASURING TESTING