Yamu Hu

Person

Allen, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
MEMS gyroscope control circuit
- Patent number 12,111,158
- Issue date Oct 8, 2024
- STMicroelectronics, Inc.
- Deyou Fang
- G01 - MEASURING TESTING
Information Patent Grant
Sensing an ICMFB output to detect functional state of a mems sensor
- Patent number 12,092,653
- Issue date Sep 17, 2024
- STMicroelectronics, Inc.
- Davy Choi
- G01 - MEASURING TESTING
Information Patent Grant
MEMS gyroscope self-test using a technique for deflection of the se...
- Patent number 11,719,540
- Issue date Aug 8, 2023
- STMicroelectronics, Inc.
- Yamu Hu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
MEMS gyroscope control circuit
- Patent number 11,662,205
- Issue date May 30, 2023
- STMicroelectronics, Inc.
- Deyou Fang
- G01 - MEASURING TESTING
Information Patent Grant
MEMS accelerometer self-test using an active mobile mass deflection...
- Patent number 11,320,452
- Issue date May 3, 2022
- STMicroelectronics, Inc.
- Yamu Hu
- G01 - MEASURING TESTING
Information Patent Grant
MEMS gyroscope self-test using a technique for deflection of the se...
- Patent number 11,255,670
- Issue date Feb 22, 2022
- STMicroelectronics, Inc.
- Yamu Hu
- G01 - MEASURING TESTING
Information Patent Grant
MEMS gyroscope control circuit
- Patent number 11,175,138
- Issue date Nov 16, 2021
- STMicroelectronics, Inc.
- Deyou Fang
- G01 - MEASURING TESTING
Information Patent Grant
MEMS gyroscope start-up process and circuit
- Patent number 11,162,790
- Issue date Nov 2, 2021
- STMicroelectronics, Inc.
- Deyou Fang
- G01 - MEASURING TESTING
Information Patent Grant
Sensing an ICMFB output to detect functional state of a MEMS sensor
- Patent number 11,143,670
- Issue date Oct 12, 2021
- STMicroelectronics, Inc.
- Davy Choi
- G01 - MEASURING TESTING
Information Patent Grant
Current modulation circuit
- Patent number 9,568,927
- Issue date Feb 14, 2017
- STMicroelectronics, Inc.
- Tom Youssef
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
MEMS GYROSCOPE START-UP PROCESS AND CIRCUIT
- Publication number 20230314138
- Publication date Oct 5, 2023
- STMicroelectronics, Inc.
- Yamu HU
- G01 - MEASURING TESTING
Information Patent Application
MEMS GYROSCOPE CONTROL CIRCUIT
- Publication number 20230273024
- Publication date Aug 31, 2023
- STMicroelectronics, Inc.
- Deyou FANG
- G01 - MEASURING TESTING
Information Patent Application
MEMS ACCELEROMETER SELF-TEST USING A VARIABLE EXCITATION VOLTAGE AN...
- Publication number 20230128205
- Publication date Apr 27, 2023
- STMicroelectronics S.r.l
- Marco GARBARINO
- G01 - MEASURING TESTING
Information Patent Application
MEMS GYROSCOPE SELF-TEST USING A TECHNIQUE FOR DEFLECTION OF THE SE...
- Publication number 20220128360
- Publication date Apr 28, 2022
- STMicroelectronics, Inc.
- Yamu HU
- G01 - MEASURING TESTING
Information Patent Application
MEMS GYROSCOPE CONTROL CIRCUIT
- Publication number 20220034659
- Publication date Feb 3, 2022
- STMicroelectronics, Inc.
- Deyou FANG
- G01 - MEASURING TESTING
Information Patent Application
SENSING AN ICMFB OUTPUT TO DETECT FUNCTIONAL STATE OF A MEMS SENSOR
- Publication number 20210405085
- Publication date Dec 30, 2021
- STMicroelectronics, Inc.
- Davy Choi
- G01 - MEASURING TESTING
Information Patent Application
MEMS ACCELEROMETER SELF-TEST USING AN ACTIVE MOBILE MASS DEFLECTION...
- Publication number 20200408805
- Publication date Dec 31, 2020
- STMicroelectronics, Inc.
- Yamu HU
- G01 - MEASURING TESTING
Information Patent Application
MEMS GYROSCOPE CONTROL CIRCUIT
- Publication number 20200408525
- Publication date Dec 31, 2020
- STMicroelectronics, Inc.
- Deyou FANG
- G01 - MEASURING TESTING
Information Patent Application
MEMS GYROSCOPE START-UP PROCESS AND CIRCUIT
- Publication number 20200408523
- Publication date Dec 31, 2020
- STMicroelectronics, Inc.
- Deyou FANG
- G01 - MEASURING TESTING
Information Patent Application
MEMS GYROSCOPE SELF-TEST USING A TECHNIQUE FOR DEFLECTION OF THE SE...
- Publication number 20200408524
- Publication date Dec 31, 2020
- STMicroelectronics, Inc.
- Yamu HU
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SENSING AN ICMFB OUTPUT TO DETECT FUNCTIONAL STATE OF A MEMS SENSOR
- Publication number 20180335446
- Publication date Nov 22, 2018
- STMicroelectronics, Inc.
- Davy Choi
- G01 - MEASURING TESTING
Information Patent Application
CURRENT MODULATION CIRCUIT
- Publication number 20150323944
- Publication date Nov 12, 2015
- STMicroelectronics, Inc.
- Tom Youssef
- G05 - CONTROLLING REGULATING

Person

Patents Grantslast 30 patents

MEMS gyroscope control circuit

Sensing an ICMFB output to detect functional state of a mems sensor

MEMS gyroscope self-test using a technique for deflection of the se...

MEMS gyroscope control circuit

MEMS accelerometer self-test using an active mobile mass deflection...

MEMS gyroscope self-test using a technique for deflection of the se...

MEMS gyroscope control circuit

MEMS gyroscope start-up process and circuit

Sensing an ICMFB output to detect functional state of a MEMS sensor

Current modulation circuit

Patents Applicationslast 30 patents

MEMS GYROSCOPE START-UP PROCESS AND CIRCUIT

MEMS GYROSCOPE CONTROL CIRCUIT

MEMS ACCELEROMETER SELF-TEST USING A VARIABLE EXCITATION VOLTAGE AN...

MEMS GYROSCOPE SELF-TEST USING A TECHNIQUE FOR DEFLECTION OF THE SE...

MEMS GYROSCOPE CONTROL CIRCUIT

SENSING AN ICMFB OUTPUT TO DETECT FUNCTIONAL STATE OF A MEMS SENSOR

MEMS ACCELEROMETER SELF-TEST USING AN ACTIVE MOBILE MASS DEFLECTION...

MEMS GYROSCOPE CONTROL CIRCUIT

MEMS GYROSCOPE START-UP PROCESS AND CIRCUIT

MEMS GYROSCOPE SELF-TEST USING A TECHNIQUE FOR DEFLECTION OF THE SE...

SENSING AN ICMFB OUTPUT TO DETECT FUNCTIONAL STATE OF A MEMS SENSOR

CURRENT MODULATION CIRCUIT