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Yan AVNIEL
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Rehovot, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Image generation for examination of a semiconductor specimen
Patent number
11,995,848
Issue date
May 28, 2024
Applied Materials Israel Ltd.
David Uliel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Measuring height difference in patterns on semiconductor wafers
Patent number
11,301,983
Issue date
Apr 12, 2022
Applied Materials Israel Ltd.
Ishai Schwarzband
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Measuring height difference in patterns on semiconductor wafers
Patent number
10,748,272
Issue date
Aug 18, 2020
Applied Materials Israel Ltd.
Ishai Schwarzband
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Technique for inspecting semiconductor wafers
Patent number
10,636,140
Issue date
Apr 28, 2020
Applied Materials Israel Ltd.
Ishai Schwarzband
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
IMAGE GENERATION FOR EXAMINATION OF A SEMICONDUCTOR SPECIMEN
Publication number
20220301196
Publication date
Sep 22, 2022
APPLIED MATERIALS ISRAEL LTD.
David ULIEL
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEASURING HEIGHT DIFFERENCE IN PATTERNS ON SEMICONDUCTOR WAFERS
Publication number
20200380668
Publication date
Dec 3, 2020
APPLIED MATERIALS ISRAEL LTD.
Ishai SCHWARZBAND
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
TECHNIQUE FOR INSPECTING SEMICONDUCTOR WAFERS
Publication number
20180336671
Publication date
Nov 22, 2018
APPLIED MATERIALS ISRAEL LTD.
Ishai SCHWARZBAND
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEASURING HEIGHT DIFFERENCE IN PATTERNS ON SEMICONDUCTOR WAFERS
Publication number
20180336675
Publication date
Nov 22, 2018
APPLIED MATERIALS ISRAEL LTD.
Ishai SCHWARZBAND
G06 - COMPUTING CALCULATING COUNTING