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Yan BONDAR
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Waldkirch, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Integrated rotation angle determining sensor unit in a measuring sy...
Patent number
11,604,081
Issue date
Mar 14, 2023
TDK-MICRONAS GMBH
Yan Bondar
G01 - MEASURING TESTING
Information
Patent Grant
Integrated rotation-angle sensor unit in a measuring system for rot...
Patent number
11,486,733
Issue date
Nov 1, 2022
TDK-MICRONAS GMBH
Yan Bondar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Measuring system for determining the angle of rotation
Patent number
10,564,003
Issue date
Feb 18, 2020
TDK-MICRONAS GMBH
Yan Bondar
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for calculating a correction factor for an ang...
Patent number
10,161,762
Issue date
Dec 25, 2018
TDK-MICRONAS GMBH
Yan Bondar
G01 - MEASURING TESTING
Information
Patent Grant
Measuring system and drive system
Patent number
10,119,840
Issue date
Nov 6, 2018
TDK-MICRONAS GMBH
Yan Bondar
G01 - MEASURING TESTING
Information
Patent Grant
Device for measurement of an angle of an axis of rotation
Patent number
10,072,944
Issue date
Sep 11, 2018
TDK-MICRONAS GMBH
Tobias Klocke
G01 - MEASURING TESTING
Information
Patent Grant
Measurement system
Patent number
9,810,553
Issue date
Nov 7, 2017
TDK-MICRONAS GMBH
Yan Bondar
G01 - MEASURING TESTING
Information
Patent Grant
Measuring system
Patent number
9,322,637
Issue date
Apr 26, 2016
Micronas GmbH
Yan Bondar
G01 - MEASURING TESTING
Information
Patent Grant
Control device for an electrical appliance
Patent number
9,093,237
Issue date
Jul 28, 2015
Micronas GmbH
Yan Bondar
F24 - HEATING RANGES VENTILATING
Patents Applications
last 30 patents
Information
Patent Application
INTEGRATED ROTATION ANGLE DETERMINING SENSOR UNIT IN A MEASURING SY...
Publication number
20210063204
Publication date
Mar 4, 2021
TDK - Micronas GmbH
Yan BONDAR
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED ROTATION-ANGLE SENSOR UNIT IN A MEASURING SYSTEM FOR ROT...
Publication number
20210055132
Publication date
Feb 25, 2021
TDK - Micronas GmbH
Yan BONDAR
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MEASURING SYSTEM FOR DETERMINING THE ANGLE OF ROTATION
Publication number
20180283900
Publication date
Oct 4, 2018
TDK - Micronas GmbH
Yan BONDAR
G01 - MEASURING TESTING
Information
Patent Application
Method And Apparatus For Calculating A Correction Factor For An Ang...
Publication number
20160091340
Publication date
Mar 31, 2016
Micronas GmbH
Yan BONDAR
G01 - MEASURING TESTING
Information
Patent Application
MEASURING SYSTEM AND DRIVE SYSTEM
Publication number
20160025521
Publication date
Jan 28, 2016
Micronas GmbH
Yan BONDAR
G01 - MEASURING TESTING
Information
Patent Application
Device for Measurement of an Angle of an Axis of Rotation
Publication number
20150177023
Publication date
Jun 25, 2015
Tobias Klocke
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT SYSTEM
Publication number
20150168124
Publication date
Jun 18, 2015
Micronas GmbH
Yan BONDAR
G01 - MEASURING TESTING
Information
Patent Application
MEASURING SYSTEM
Publication number
20140191749
Publication date
Jul 10, 2014
Micronas GmbH
Yan BONDAR
G01 - MEASURING TESTING
Information
Patent Application
CONTROL DEVICE FOR AN ELECTRICAL APPLIANCE
Publication number
20130200965
Publication date
Aug 8, 2013
Micronas GmbH
Yan BONDAR
H01 - BASIC ELECTRIC ELEMENTS